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Title: Multilayer Laue Lens: A Brief History and Current Status

Authors:
; ; ; ; ; ; ; ; ;
Publication Date:
Research Org.:
Brookhaven National Laboratory (BNL), Upton, NY (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1354444
Report Number(s):
BNL-112961-2016-JA
Journal ID: ISSN 0894-0886
DOE Contract Number:
SC00112704
Resource Type:
Journal Article
Resource Relation:
Journal Name: Synchrotron Radiation News; Journal Volume: 29; Journal Issue: 4
Country of Publication:
United States
Language:
English

Citation Formats

Conley, Ray, Bouet, Nathalie, Chu, Yong S., Huang, Xiaojing, Kang, Hyon Chol, Macrander, Albert T., Maser, Jörg, Nazaretski, Evgeny, Stephenson, G. Brian, and Yan, Hanfei. Multilayer Laue Lens: A Brief History and Current Status. United States: N. p., 2016. Web. doi:10.1080/08940886.2016.1198669.
Conley, Ray, Bouet, Nathalie, Chu, Yong S., Huang, Xiaojing, Kang, Hyon Chol, Macrander, Albert T., Maser, Jörg, Nazaretski, Evgeny, Stephenson, G. Brian, & Yan, Hanfei. Multilayer Laue Lens: A Brief History and Current Status. United States. doi:10.1080/08940886.2016.1198669.
Conley, Ray, Bouet, Nathalie, Chu, Yong S., Huang, Xiaojing, Kang, Hyon Chol, Macrander, Albert T., Maser, Jörg, Nazaretski, Evgeny, Stephenson, G. Brian, and Yan, Hanfei. 2016. "Multilayer Laue Lens: A Brief History and Current Status". United States. doi:10.1080/08940886.2016.1198669.
@article{osti_1354444,
title = {Multilayer Laue Lens: A Brief History and Current Status},
author = {Conley, Ray and Bouet, Nathalie and Chu, Yong S. and Huang, Xiaojing and Kang, Hyon Chol and Macrander, Albert T. and Maser, Jörg and Nazaretski, Evgeny and Stephenson, G. Brian and Yan, Hanfei},
abstractNote = {},
doi = {10.1080/08940886.2016.1198669},
journal = {Synchrotron Radiation News},
number = 4,
volume = 29,
place = {United States},
year = 2016,
month = 7
}
  • No abstract prepared.
  • A multilayer Laue lens (MLL) is an x-ray focusing optic fabricated from a multilayer structure consisting of thousands of layers of two different materials produced by thin-film deposition. The sequence of layer thicknesses is controlled to satisfy the Fresnel zone plate law and the multilayer is sectioned to form the optic. An improved MLL geometry can be created by growing each layer with an in-plane thickness gradient to form a wedge, so that every interface makes the correct angle with the incident beam for symmetric Bragg diffraction. The ultimate hard x-ray focusing performance of a wedged MLL has been predictedmore » to be significantly better than that of a nonwedged MLL, giving subnanometer resolution with high efficiency. Here, we describe a method to deposit the multilayer structure needed for an ideal wedged MLL and report our initial deposition results to produce these structures.« less
  • We have fabricated partial Multilayer Laue Lens (MLL) linear zone plate structures with thousands of alternating WSi{sub 2} and Si layers and various outermost zone widths according to the Fresnel zone plate formula. Using partial MLL structures, we were able to focus hard X-rays to line foci with a width of 30 nm and below. Here, we describe challenges and approaches used to bond these multilayers to achieve line and point focusing. Bonding was done by coating two multilayers with AuSn and heating in a vacuum oven at 280-300 C. X-ray reflectivity measurements confirmed that there was no change inmore » the multilayers after heating to 350 C. A bonded MLL was polished to a 5-25 {micro}m wedge without cracking. SEM image analyses found well-positioned multilayers after bonding. These results demonstrate the feasibility of a bonded full MLL for focusing hard X-rays.« less
  • Scanning electron microscope images obtained on a cross-section of a sputtered multilayer structure have proven to be crucial for qualifying these films for their intended use as a multilayer Laue lens. The quality of the linear Fresnel zone structure is assessed by means of image processing and analyses, and these analyses are then used to qualify the structure for further lens processing. The image analysis as well as problematic SEM artifacts are discussed.
  • We present a simulation result of the focusing performance of a multilayer Laue lens (MLL) with imperfections. Imperfections we have studied correspond to deviations of sequence of layers in the fabricated structure from the zone plate law. The actual sequence of layers of the MLL is measured by scanning electron microscope (SEM), and fitted by second order polynomials. X-ray characterization of the MLL structures is performed using coherent X-rays at the Advanced Photon Source. We observe very good agreement between experiment and simulation. This demonstrates that our simulation method can serve as an efficient tool to characterize the focusing performancemore » of MLLs with imperfections, and thereby allows us to provide feedback following deposition and fabrication of the MLL structures and optimization of focusing structures prior to X-ray characterization.« less