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Title: Focusing hard x rays beyond the critical angle of total reflection by adiabatically focusing lenses

Abstract

In response to the conjecture that the numerical aperture of x-ray optics is fundamentally limited by the critical angle of total reflection, the concept of adiabatically focusing refractive lenses was proposed to overcome this limit. Here, we present an experimental realization of these optics made of silicon and demonstrate that they indeed focus 20 keV x rays to a 18.4 nm focus with a numerical aperture of 1.73(9) × 10 –3 that clearly exceeds the critical angle of total reflection of 1.55 mrad.

Authors:
 [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1]; ORCiD logo [1];  [2];  [3];  [2];  [2];  [4]
  1. Technische Univ. Dresden, Dresden (Germany)
  2. Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany)
  3. Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany); SLAC National Accelerator Lab., Menlo Park, CA (United States)
  4. Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany); Univ. Hamburg, Hamburg (Germany)
Publication Date:
Research Org.:
SLAC National Accelerator Lab., Menlo Park, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1353210
Grant/Contract Number:  
AC02-76SF00515
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Volume: 110; Journal Issue: 10; Journal ID: ISSN 0003-6951
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
73 NUCLEAR PHYSICS AND RADIATION PHYSICS

Citation Formats

Patommel, Jens, Klare, Susanne, Hoppe, Robert, Ritter, Stephan, Samberg, Dirk, Wittwer, Felix, Jahn, Andreas, Richter, Karola, Wenzel, Christian, Bartha, Johann W., Scholz, Maria, Seiboth, Frank, Boesenberg, Ulrike, Falkenberg, Gerald, and Schroer, Christian G.. Focusing hard x rays beyond the critical angle of total reflection by adiabatically focusing lenses. United States: N. p., 2017. Web. doi:10.1063/1.4977882.
Patommel, Jens, Klare, Susanne, Hoppe, Robert, Ritter, Stephan, Samberg, Dirk, Wittwer, Felix, Jahn, Andreas, Richter, Karola, Wenzel, Christian, Bartha, Johann W., Scholz, Maria, Seiboth, Frank, Boesenberg, Ulrike, Falkenberg, Gerald, & Schroer, Christian G.. Focusing hard x rays beyond the critical angle of total reflection by adiabatically focusing lenses. United States. doi:10.1063/1.4977882.
Patommel, Jens, Klare, Susanne, Hoppe, Robert, Ritter, Stephan, Samberg, Dirk, Wittwer, Felix, Jahn, Andreas, Richter, Karola, Wenzel, Christian, Bartha, Johann W., Scholz, Maria, Seiboth, Frank, Boesenberg, Ulrike, Falkenberg, Gerald, and Schroer, Christian G.. Mon . "Focusing hard x rays beyond the critical angle of total reflection by adiabatically focusing lenses". United States. doi:10.1063/1.4977882. https://www.osti.gov/servlets/purl/1353210.
@article{osti_1353210,
title = {Focusing hard x rays beyond the critical angle of total reflection by adiabatically focusing lenses},
author = {Patommel, Jens and Klare, Susanne and Hoppe, Robert and Ritter, Stephan and Samberg, Dirk and Wittwer, Felix and Jahn, Andreas and Richter, Karola and Wenzel, Christian and Bartha, Johann W. and Scholz, Maria and Seiboth, Frank and Boesenberg, Ulrike and Falkenberg, Gerald and Schroer, Christian G.},
abstractNote = {In response to the conjecture that the numerical aperture of x-ray optics is fundamentally limited by the critical angle of total reflection, the concept of adiabatically focusing refractive lenses was proposed to overcome this limit. Here, we present an experimental realization of these optics made of silicon and demonstrate that they indeed focus 20 keV x rays to a 18.4 nm focus with a numerical aperture of 1.73(9) × 10–3 that clearly exceeds the critical angle of total reflection of 1.55 mrad.},
doi = {10.1063/1.4977882},
journal = {Applied Physics Letters},
number = 10,
volume = 110,
place = {United States},
year = {Mon Mar 06 00:00:00 EST 2017},
month = {Mon Mar 06 00:00:00 EST 2017}
}

Journal Article:
Free Publicly Available Full Text
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