Focusing hard x rays beyond the critical angle of total reflection by adiabatically focusing lenses

Patommel, Jens; Klare, Susanne; Hoppe, Robert; Ritter, Stephan; Samberg, Dirk; Wittwer, Felix; Jahn, Andreas; Richter, Karola; Wenzel, Christian; Bartha, Johann W.; Scholz, Maria; Seiboth, Frank; Boesenberg, Ulrike; Falkenberg, Gerald; Schroer, Christian G.

doi:10.1063/1.4977882

Title: Focusing hard x rays beyond the critical angle of total reflection by adiabatically focusing lenses

Journal Article · Mon Mar 06 00:00:00 EST 2017 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4977882· OSTI ID:1353210

Patommel, Jens ^[1]; Klare, Susanne ^[1]; Hoppe, Robert ^[1]; Ritter, Stephan ^[1]; Samberg, Dirk ^[1]; Wittwer, Felix ^[1]; Jahn, Andreas ^[1]; Richter, Karola ^[1]; Wenzel, Christian ^[1];

^[1]; Scholz, Maria ^[2]; Seiboth, Frank ^[3]; Boesenberg, Ulrike ^[2]; Falkenberg, Gerald ^[2]; Schroer, Christian G. ^[4]

Technische Univ. Dresden, Dresden (Germany)
Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany)
Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany); SLAC National Accelerator Lab., Menlo Park, CA (United States)
Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany); Univ. Hamburg, Hamburg (Germany)

In response to the conjecture that the numerical aperture of x-ray optics is fundamentally limited by the critical angle of total reflection, the concept of adiabatically focusing refractive lenses was proposed to overcome this limit. Here, we present an experimental realization of these optics made of silicon and demonstrate that they indeed focus 20 keV x rays to a 18.4 nm focus with a numerical aperture of 1.73(9) × 10^–3 that clearly exceeds the critical angle of total reflection of 1.55 mrad.

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Research Organization:: SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States)

Sponsoring Organization:: USDOE

Grant/Contract Number:: AC02-76SF00515

OSTI ID:: 1353210

Journal Information:: Applied Physics Letters, Vol. 110, Issue 10; ISSN 0003-6951

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 26 works

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