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Title: High-resolution three-dimensional structural microscopy by single-angle Bragg ptychography

Abstract

Coherent X-ray microscopy by phase retrieval of Bragg diffraction intensities enables lattice distortions within a crystal to be imaged at nanometre-scale spatial resolutions in three dimensions. While this capability can be used to resolve structure–property relationships at the nanoscale under working conditions, strict data measurement requirements can limit the application of current approaches. Here, in this work, we introduce an efficient method of imaging three-dimensional (3D) nanoscale lattice behaviour and strain fields in crystalline materials with a methodology that we call 3D Bragg projection ptychography (3DBPP). This method enables 3D image reconstruction of a crystal volume from a series of two-dimensional X-ray Bragg coherent intensity diffraction patterns measured at a single incident beam angle. Structural information about the sample is encoded along two reciprocal-space directions normal to the Bragg diffracted exit beam, and along the third dimension in real space by the scanning beam. Finally, we present our approach with an analytical derivation, a numerical demonstration, and an experimental reconstruction of lattice distortions in a component of a nanoelectronic prototype device.

Authors:
 [1];  [2];  [3];  [4];  [5];  [1];  [2]
  1. Argonne National Lab. (ANL), Argonne, IL (United States). Materials Science Division
  2. Institut Fresnel, Marseille (France). Aix-Marseille University, CNRS, Centrale Marseille
  3. Argonne National Lab. (ANL), Argonne, IL (United States). Center for Nanoscale Materials
  4. IBM T.J. Watson Research Center, Yorktown Heights, NY (United States)
  5. BM Semiconductor Research and Development Center, Hopewell Junction, NY (United States)
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1352574
Grant/Contract Number:  
AC02-06CH11357
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
Nature Materials
Additional Journal Information:
Journal Volume: 16; Journal Issue: 2; Journal ID: ISSN 1476-1122
Publisher:
Nature Publishing Group
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Hruszkewycz, S. O., Allain, M., Holt, M. V., Murray, C. E., Holt, J. R., Fuoss, P. H., and Chamard, V. High-resolution three-dimensional structural microscopy by single-angle Bragg ptychography. United States: N. p., 2016. Web. doi:10.1038/NMAT4798.
Hruszkewycz, S. O., Allain, M., Holt, M. V., Murray, C. E., Holt, J. R., Fuoss, P. H., & Chamard, V. High-resolution three-dimensional structural microscopy by single-angle Bragg ptychography. United States. doi:10.1038/NMAT4798.
Hruszkewycz, S. O., Allain, M., Holt, M. V., Murray, C. E., Holt, J. R., Fuoss, P. H., and Chamard, V. Mon . "High-resolution three-dimensional structural microscopy by single-angle Bragg ptychography". United States. doi:10.1038/NMAT4798. https://www.osti.gov/servlets/purl/1352574.
@article{osti_1352574,
title = {High-resolution three-dimensional structural microscopy by single-angle Bragg ptychography},
author = {Hruszkewycz, S. O. and Allain, M. and Holt, M. V. and Murray, C. E. and Holt, J. R. and Fuoss, P. H. and Chamard, V.},
abstractNote = {Coherent X-ray microscopy by phase retrieval of Bragg diffraction intensities enables lattice distortions within a crystal to be imaged at nanometre-scale spatial resolutions in three dimensions. While this capability can be used to resolve structure–property relationships at the nanoscale under working conditions, strict data measurement requirements can limit the application of current approaches. Here, in this work, we introduce an efficient method of imaging three-dimensional (3D) nanoscale lattice behaviour and strain fields in crystalline materials with a methodology that we call 3D Bragg projection ptychography (3DBPP). This method enables 3D image reconstruction of a crystal volume from a series of two-dimensional X-ray Bragg coherent intensity diffraction patterns measured at a single incident beam angle. Structural information about the sample is encoded along two reciprocal-space directions normal to the Bragg diffracted exit beam, and along the third dimension in real space by the scanning beam. Finally, we present our approach with an analytical derivation, a numerical demonstration, and an experimental reconstruction of lattice distortions in a component of a nanoelectronic prototype device.},
doi = {10.1038/NMAT4798},
journal = {Nature Materials},
number = 2,
volume = 16,
place = {United States},
year = {Mon Nov 21 00:00:00 EST 2016},
month = {Mon Nov 21 00:00:00 EST 2016}
}

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Cited by: 17 works
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Works referenced in this record:

Imaging Local Polarization in Ferroelectric Thin Films by Coherent X-Ray Bragg Projection Ptychography
journal, April 2013

  • Hruszkewycz, S. O.; Highland, M. J.; Holt, M. V.
  • Physical Review Letters, Vol. 110, Issue 17, Article No. 177601
  • DOI: 10.1103/PhysRevLett.110.177601