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Title: Electron ptychographic phase imaging of light elements in crystalline materials using Wigner distribution deconvolution

Abstract

Recent development in fast pixelated detector technology has allowed a two dimensional diffraction pattern to be recorded at every probe position of a two dimensional raster scan in a scanning transmission electron microscope (STEM), forming an information-rich four dimensional (4D) dataset. Electron ptychography has been shown to enable efficient coherent phase imaging of weakly scattering objects from a 4D dataset recorded using a focused electron probe, which is optimised for simultaneous incoherent Z-contrast imaging and spectroscopy in STEM. Thus coherent phase contrast and incoherent Z-contrast imaging modes can be efficiently combined to provide a good sensitivity of both light and heavy elements at atomic resolution. Here, we explore the application of electron ptychography for atomic resolution imaging of strongly scattering crystalline specimens, and present experiments on imaging crystalline specimens including samples containing defects, under dynamical channelling conditions using an aberration corrected microscope. A ptychographic reconstruction method called Wigner distribution deconvolution (WDD) was implemented. Our experimental results and simulation results suggest that ptychography provides a readily interpretable phase image and great sensitivity for imaging light elements at atomic resolution in relatively thin crystalline materials.

Authors:
 [1];  [2];  [3];  [3];  [4];  [4];  [5];  [4];  [6];  [6];  [1];  [1];  [7];  [7];  [3]
  1. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Molecular Foundry
  2. Univ. of Glasgow, Scotland (United Kingdom). School of Physics and Astronomy
  3. Univ. of Oxford (United Kingdom). Dept. of Materials
  4. PN Detector GmbH, Munich (Germany)
  5. PNSensor GmbH, Munich (Germany)
  6. JEOL Ltd., Tokyo (Japan)
  7. Ernst Ruska Centre (ER-C) for Microscopy and Spectroscopy with Electrons, Julich (Germany)
Publication Date:
Research Org.:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1352460
Alternate Identifier(s):
OSTI ID: 1417608
Grant/Contract Number:  
AC02-05CH11231
Resource Type:
Journal Article: Published Article
Journal Name:
Ultramicroscopy
Additional Journal Information:
Journal Volume: 180; Journal Issue: C; Journal ID: ISSN 0304-3991
Publisher:
Elsevier
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 4D-STEM; pixelated detectors; ptychography; phase retrieval; Wigner distribution deconvolution

Citation Formats

Yang, Hao, MacLaren, Ian, Jones, Lewys, Martinez, Gerardo T., Simson, Martin, Huth, Martin, Ryll, Henning, Soltau, Heike, Sagawa, Ryusuke, Kondo, Yukihito, Ophus, Colin, Ercius, Peter, Jin, Lei, Kovács, András, and Nellist, Peter D. Electron ptychographic phase imaging of light elements in crystalline materials using Wigner distribution deconvolution. United States: N. p., 2017. Web. doi:10.1016/j.ultramic.2017.02.006.
Yang, Hao, MacLaren, Ian, Jones, Lewys, Martinez, Gerardo T., Simson, Martin, Huth, Martin, Ryll, Henning, Soltau, Heike, Sagawa, Ryusuke, Kondo, Yukihito, Ophus, Colin, Ercius, Peter, Jin, Lei, Kovács, András, & Nellist, Peter D. Electron ptychographic phase imaging of light elements in crystalline materials using Wigner distribution deconvolution. United States. doi:10.1016/j.ultramic.2017.02.006.
Yang, Hao, MacLaren, Ian, Jones, Lewys, Martinez, Gerardo T., Simson, Martin, Huth, Martin, Ryll, Henning, Soltau, Heike, Sagawa, Ryusuke, Kondo, Yukihito, Ophus, Colin, Ercius, Peter, Jin, Lei, Kovács, András, and Nellist, Peter D. Sat . "Electron ptychographic phase imaging of light elements in crystalline materials using Wigner distribution deconvolution". United States. doi:10.1016/j.ultramic.2017.02.006.
@article{osti_1352460,
title = {Electron ptychographic phase imaging of light elements in crystalline materials using Wigner distribution deconvolution},
author = {Yang, Hao and MacLaren, Ian and Jones, Lewys and Martinez, Gerardo T. and Simson, Martin and Huth, Martin and Ryll, Henning and Soltau, Heike and Sagawa, Ryusuke and Kondo, Yukihito and Ophus, Colin and Ercius, Peter and Jin, Lei and Kovács, András and Nellist, Peter D.},
abstractNote = {Recent development in fast pixelated detector technology has allowed a two dimensional diffraction pattern to be recorded at every probe position of a two dimensional raster scan in a scanning transmission electron microscope (STEM), forming an information-rich four dimensional (4D) dataset. Electron ptychography has been shown to enable efficient coherent phase imaging of weakly scattering objects from a 4D dataset recorded using a focused electron probe, which is optimised for simultaneous incoherent Z-contrast imaging and spectroscopy in STEM. Thus coherent phase contrast and incoherent Z-contrast imaging modes can be efficiently combined to provide a good sensitivity of both light and heavy elements at atomic resolution. Here, we explore the application of electron ptychography for atomic resolution imaging of strongly scattering crystalline specimens, and present experiments on imaging crystalline specimens including samples containing defects, under dynamical channelling conditions using an aberration corrected microscope. A ptychographic reconstruction method called Wigner distribution deconvolution (WDD) was implemented. Our experimental results and simulation results suggest that ptychography provides a readily interpretable phase image and great sensitivity for imaging light elements at atomic resolution in relatively thin crystalline materials.},
doi = {10.1016/j.ultramic.2017.02.006},
journal = {Ultramicroscopy},
number = C,
volume = 180,
place = {United States},
year = {Sat Apr 01 00:00:00 EDT 2017},
month = {Sat Apr 01 00:00:00 EDT 2017}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record at 10.1016/j.ultramic.2017.02.006

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Cited by: 1 work
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