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Title: In situ x-ray scattering study of Ag island growth on Si(111) 7 × 7

Authors:
; ; ;
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
Sponsoring Org.:
National Science Foundation (NSF)
OSTI Identifier:
1352257
Resource Type:
Journal Article
Resource Relation:
Journal Name: Physical Review B; Journal Volume: 94; Journal Issue: 4
Country of Publication:
United States
Language:
ENGLISH

Citation Formats

Chen, Yiyao, Gramlich, M. W., Hayden, S. T., and Miceli, P. F. In situ x-ray scattering study of Ag island growth on Si(111) 7×7. United States: N. p., 2016. Web. doi:10.1103/PhysRevB.94.045437.
Chen, Yiyao, Gramlich, M. W., Hayden, S. T., & Miceli, P. F. In situ x-ray scattering study of Ag island growth on Si(111) 7×7. United States. doi:10.1103/PhysRevB.94.045437.
Chen, Yiyao, Gramlich, M. W., Hayden, S. T., and Miceli, P. F. 2016. "In situ x-ray scattering study of Ag island growth on Si(111) 7×7". United States. doi:10.1103/PhysRevB.94.045437.
@article{osti_1352257,
title = {In situ x-ray scattering study of Ag island growth on Si(111) 7×7},
author = {Chen, Yiyao and Gramlich, M. W. and Hayden, S. T. and Miceli, P. F.},
abstractNote = {},
doi = {10.1103/PhysRevB.94.045437},
journal = {Physical Review B},
number = 4,
volume = 94,
place = {United States},
year = 2016,
month = 7
}