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Title: Perfect X-ray focusing via fitting corrective glasses to aberrated optics

Abstract

Due to their short wavelength, X-rays can in principle be focused down to a few nanometres and below. At the same time, it is this short wavelength that puts stringent requirements on X-ray optics and their metrology. Both are limited by today’s technology. In this work, we present accurate at wavelength measurements of residual aberrations of a refractive X-ray lens using ptychography to manufacture a corrective phase plate. Together with the fitted phase plate the optics shows diffraction-limited performance, generating a nearly Gaussian beam profile with a Strehl ratio above 0.8. As a result, this scheme can be applied to any other focusing optics, thus solving the X-ray optical problem at synchrotron radiation sources and X-ray free-electron lasers.

Authors:
 [1];  [2];  [2];  [3];  [4];  [5];  [5];  [5];  [6]; ORCiD logo [6];  [6];  [6];  [7];  [7];  [2];  [2];  [2];  [8];  [8];  [8] more »;  [9] « less
  1. Technische Univ. Dresden, Dresden (Germany); Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany); SLAC National Accelerator Lab., Menlo Park, CA (United States)
  2. Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany)
  3. Technische Univ. Dresden, Dresden (Germany); Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany)
  4. Friedrich-Schiller-Univ. Jena, Jena (Germany); SLAC National Accelerator Lab., Menlo Park, CA (United States)
  5. Friedrich-Schiller-Univ. Jena, Jena (Germany)
  6. Albanova Univ. Center, Stockholm (Sweden)
  7. Diamond Light Source Ltd., Oxfordshire (United Kingdom)
  8. SLAC National Accelerator Lab., Menlo Park, CA (United States)
  9. Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany); Univ. Hamburg, Hamburg (Germany)
Publication Date:
Research Org.:
SLAC National Accelerator Lab., Menlo Park, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1352167
Grant/Contract Number:  
AC02-76SF00515
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
Nature Communications
Additional Journal Information:
Journal Volume: 8; Journal ID: ISSN 2041-1723
Publisher:
Nature Publishing Group
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; imaging and sensing; microscopy; X-rays

Citation Formats

Seiboth, Frank, Schropp, Andreas, Scholz, Maria, Wittwer, Felix, Rödel, Christian, Wünsche, Martin, Ullsperger, Tobias, Nolte, Stefan, Rahomäki, Jussi, Parfeniukas, Karolis, Giakoumidis, Stylianos, Vogt, Ulrich, Wagner, Ulrich, Rau, Christoph, Boesenberg, Ulrike, Garrevoet, Jan, Falkenberg, Gerald, Galtier, Eric C., Lee, Hae Ja, Nagler, Bob, and Schroer, Christian G. Perfect X-ray focusing via fitting corrective glasses to aberrated optics. United States: N. p., 2017. Web. doi:10.1038/ncomms14623.
Seiboth, Frank, Schropp, Andreas, Scholz, Maria, Wittwer, Felix, Rödel, Christian, Wünsche, Martin, Ullsperger, Tobias, Nolte, Stefan, Rahomäki, Jussi, Parfeniukas, Karolis, Giakoumidis, Stylianos, Vogt, Ulrich, Wagner, Ulrich, Rau, Christoph, Boesenberg, Ulrike, Garrevoet, Jan, Falkenberg, Gerald, Galtier, Eric C., Lee, Hae Ja, Nagler, Bob, & Schroer, Christian G. Perfect X-ray focusing via fitting corrective glasses to aberrated optics. United States. doi:10.1038/ncomms14623.
Seiboth, Frank, Schropp, Andreas, Scholz, Maria, Wittwer, Felix, Rödel, Christian, Wünsche, Martin, Ullsperger, Tobias, Nolte, Stefan, Rahomäki, Jussi, Parfeniukas, Karolis, Giakoumidis, Stylianos, Vogt, Ulrich, Wagner, Ulrich, Rau, Christoph, Boesenberg, Ulrike, Garrevoet, Jan, Falkenberg, Gerald, Galtier, Eric C., Lee, Hae Ja, Nagler, Bob, and Schroer, Christian G. Wed . "Perfect X-ray focusing via fitting corrective glasses to aberrated optics". United States. doi:10.1038/ncomms14623. https://www.osti.gov/servlets/purl/1352167.
@article{osti_1352167,
title = {Perfect X-ray focusing via fitting corrective glasses to aberrated optics},
author = {Seiboth, Frank and Schropp, Andreas and Scholz, Maria and Wittwer, Felix and Rödel, Christian and Wünsche, Martin and Ullsperger, Tobias and Nolte, Stefan and Rahomäki, Jussi and Parfeniukas, Karolis and Giakoumidis, Stylianos and Vogt, Ulrich and Wagner, Ulrich and Rau, Christoph and Boesenberg, Ulrike and Garrevoet, Jan and Falkenberg, Gerald and Galtier, Eric C. and Lee, Hae Ja and Nagler, Bob and Schroer, Christian G.},
abstractNote = {Due to their short wavelength, X-rays can in principle be focused down to a few nanometres and below. At the same time, it is this short wavelength that puts stringent requirements on X-ray optics and their metrology. Both are limited by today’s technology. In this work, we present accurate at wavelength measurements of residual aberrations of a refractive X-ray lens using ptychography to manufacture a corrective phase plate. Together with the fitted phase plate the optics shows diffraction-limited performance, generating a nearly Gaussian beam profile with a Strehl ratio above 0.8. As a result, this scheme can be applied to any other focusing optics, thus solving the X-ray optical problem at synchrotron radiation sources and X-ray free-electron lasers.},
doi = {10.1038/ncomms14623},
journal = {Nature Communications},
number = ,
volume = 8,
place = {United States},
year = {Wed Mar 01 00:00:00 EST 2017},
month = {Wed Mar 01 00:00:00 EST 2017}
}

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Cited by: 12 works
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