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Title: Manually operated small envelope scanner system

Abstract

A scanner system and method for acquisition of position-based ultrasonic inspection data are described. The scanner system includes an inspection probe and a first non-contact linear encoder having a first sensor and a first scale to track inspection probe position. The first sensor is positioned to maintain a continuous non-contact interface between the first sensor and the first scale and to maintain a continuous alignment of the first sensor with the inspection probe. The scanner system may be used to acquire two-dimensional inspection probe position data by including a second non-contact linear encoder having a second sensor and a second scale, the second sensor positioned to maintain a continuous non-contact interface between the second sensor and the second scale and to maintain a continuous alignment of the second sensor with the first sensor.

Inventors:
Publication Date:
Research Org.:
(United States); Bettis Atomic Power Laboratory (BAPL), West Mifflin, PA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1351825
Patent Number(s):
9,625,421
Application Number:
14/254,058
Assignee:
U.S. Department of Energy BAPL
DOE Contract Number:  
AC11-98PN38206
Resource Type:
Patent
Resource Relation:
Patent File Date: 2014 Apr 16
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

Citation Formats

Sword, Charles Keith. Manually operated small envelope scanner system. United States: N. p., 2017. Web.
Sword, Charles Keith. Manually operated small envelope scanner system. United States.
Sword, Charles Keith. Tue . "Manually operated small envelope scanner system". United States. doi:. https://www.osti.gov/servlets/purl/1351825.
@article{osti_1351825,
title = {Manually operated small envelope scanner system},
author = {Sword, Charles Keith},
abstractNote = {A scanner system and method for acquisition of position-based ultrasonic inspection data are described. The scanner system includes an inspection probe and a first non-contact linear encoder having a first sensor and a first scale to track inspection probe position. The first sensor is positioned to maintain a continuous non-contact interface between the first sensor and the first scale and to maintain a continuous alignment of the first sensor with the inspection probe. The scanner system may be used to acquire two-dimensional inspection probe position data by including a second non-contact linear encoder having a second sensor and a second scale, the second sensor positioned to maintain a continuous non-contact interface between the second sensor and the second scale and to maintain a continuous alignment of the second sensor with the first sensor.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Apr 18 00:00:00 EDT 2017},
month = {Tue Apr 18 00:00:00 EDT 2017}
}

Patent:

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