Full information acquisition in scanning probe microscopy and spectroscopy

Patent · 04 April 2017

OSTI ID:1349677

Jesse, Stephen; Belianinov, Alex; Kalinin, Sergei V.; Somnath, Suhas

Apparatus and methods are described for scanning probe microscopy and spectroscopy based on acquisition of full probe response. The full probe response contains valuable information about the probe-sample interaction that is lost in traditional scanning probe microscopy and spectroscopy methods. The full probe response is analyzed post data acquisition using fast Fourier transform and adaptive filtering, as well as multivariate analysis. The full response data is further compressed to retain only statistically significant components before being permanently stored.

• Research Organization: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
• Sponsoring Organization: USDOE
• DOE Contract Number: AC05-00OR22725
• Assignee: UT-Battelle, LLC
• Patent Number(s): 9,612,257
• Application Number: 15/063,144
• OSTI ID: 1349677
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE