Electronic interconnects and devices with topological surface states and methods for fabricating same

Yazdani, Ali; Ong, N. Phuan; Cava, Robert J.

Electronic interconnects and devices with topological surface states and methods for fabricating same

Patent · 04 April 2017

OSTI ID:1349670

Yazdani, Ali; Ong, N. Phuan; Cava, Robert J.

An interconnect is disclosed with enhanced immunity of electrical conductivity to defects. The interconnect includes a material with charge carriers having topological surface states. Also disclosed is a method for fabricating such interconnects. Also disclosed is an integrated circuit including such interconnects. Also disclosed is a gated electronic device including a material with charge carriers having topological surface states.

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Research Organization:: The Trustees of Princeton University, Princeton, NJ (United States)

Sponsoring Organization:: USDOE

DOE Contract Number:: FG02-07ER46419

Assignee:: THE TRUSTEES OF PRINCETON UNIVERSITY

Patent Number(s):: 9,613,905

Application Number:: 14/919,008

OSTI ID:: 1349670

Country of Publication:: United States

Language:: English

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