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Title: New insights on ion track morphology in pyrochlores by aberration corrected scanning transmission electron microscopy

Abstract

Here we demonstrate the enhanced imaging capabilities of an aberration corrected scanning transmission electron microscope to advance the understanding of ion track structure in pyrochlore structured materials (i.e., Gd 2Ti 2O 7 and Gd 2TiZrO 7). Track formation occurs due to the inelastic transfer of energy from incident ions to electrons, and atomic-level details of track morphology as a function of energy-loss are revealed in the present work. A comparison of imaging details obtained by varying collection angles of detectors is discussed in the present work. A quantitative analysis of phase identification using high-angle annular dark field imaging is performed on the ion tracks. Finally, a novel 3-dimensional track reconstruction method is provided that is based on depth dependent imaging of the ion tracks. The technique is used in extracting the atomic-level details of nanoscale features, such as the disordered ion tracks, which are embedded in relatively thicker matrix. Another relevance of the method is shown by measuring the tilt of the ion tracks relative to the electron beam incidence that helps in knowing the structure and geometry of ion tracks quantitatively.

Authors:
ORCiD logo [1];  [2]; ORCiD logo [3];  [4];  [1];  [2]
  1. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
  2. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States); Univ. of Tennessee, Knoxville, TN (United States)
  3. Helmholtz-Zentrum Dresden (HZB), (Germany)
  4. Technical Univ. of Darmstadt (Germany); GSI-Helmholtzzentrum fur Schwerionenforschung, Darmstadt (Germany)
Publication Date:
Research Org.:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
1348323
Grant/Contract Number:  
AC05-00OR22725
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
Journal of Materials Research
Additional Journal Information:
Journal Volume: 32; Journal Issue: 05; Journal ID: ISSN 0884-2914
Publisher:
Materials Research Society
Country of Publication:
United States
Language:
English
Subject:
72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS; Ion Track; Pyroclore; Electron Microscopy

Citation Formats

Sachan, Ritesh, Zhang, Yanwen, Ou, Xin, Trautmann, Christina, Chisholm, Matthew F., and Weber, William J. New insights on ion track morphology in pyrochlores by aberration corrected scanning transmission electron microscopy. United States: N. p., 2016. Web. doi:10.1557/jmr.2016.418.
Sachan, Ritesh, Zhang, Yanwen, Ou, Xin, Trautmann, Christina, Chisholm, Matthew F., & Weber, William J. New insights on ion track morphology in pyrochlores by aberration corrected scanning transmission electron microscopy. United States. doi:10.1557/jmr.2016.418.
Sachan, Ritesh, Zhang, Yanwen, Ou, Xin, Trautmann, Christina, Chisholm, Matthew F., and Weber, William J. Tue . "New insights on ion track morphology in pyrochlores by aberration corrected scanning transmission electron microscopy". United States. doi:10.1557/jmr.2016.418. https://www.osti.gov/servlets/purl/1348323.
@article{osti_1348323,
title = {New insights on ion track morphology in pyrochlores by aberration corrected scanning transmission electron microscopy},
author = {Sachan, Ritesh and Zhang, Yanwen and Ou, Xin and Trautmann, Christina and Chisholm, Matthew F. and Weber, William J.},
abstractNote = {Here we demonstrate the enhanced imaging capabilities of an aberration corrected scanning transmission electron microscope to advance the understanding of ion track structure in pyrochlore structured materials (i.e., Gd2Ti2O7 and Gd2TiZrO7). Track formation occurs due to the inelastic transfer of energy from incident ions to electrons, and atomic-level details of track morphology as a function of energy-loss are revealed in the present work. A comparison of imaging details obtained by varying collection angles of detectors is discussed in the present work. A quantitative analysis of phase identification using high-angle annular dark field imaging is performed on the ion tracks. Finally, a novel 3-dimensional track reconstruction method is provided that is based on depth dependent imaging of the ion tracks. The technique is used in extracting the atomic-level details of nanoscale features, such as the disordered ion tracks, which are embedded in relatively thicker matrix. Another relevance of the method is shown by measuring the tilt of the ion tracks relative to the electron beam incidence that helps in knowing the structure and geometry of ion tracks quantitatively.},
doi = {10.1557/jmr.2016.418},
journal = {Journal of Materials Research},
number = 05,
volume = 32,
place = {United States},
year = {Tue Dec 13 00:00:00 EST 2016},
month = {Tue Dec 13 00:00:00 EST 2016}
}

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