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Title: Measuring and predicting the diffraction properties of cylindrically bent potassium acid phthalate, KAP(001), crystals

Authors:
ORCiD logo [1];  [1]
  1. National Security Technologies (NSTec), LLC, Livermore, California 94550, USA
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1348266
Resource Type:
Journal Article: Publisher's Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 88; Journal Issue: 2; Related Information: CHORUS Timestamp: 2018-02-14 12:32:45; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics
Country of Publication:
United States
Language:
English

Citation Formats

Haugh, M. J., and Jacoby, K. D. Measuring and predicting the diffraction properties of cylindrically bent potassium acid phthalate, KAP(001), crystals. United States: N. p., 2017. Web. doi:10.1063/1.4975775.
Haugh, M. J., & Jacoby, K. D. Measuring and predicting the diffraction properties of cylindrically bent potassium acid phthalate, KAP(001), crystals. United States. doi:10.1063/1.4975775.
Haugh, M. J., and Jacoby, K. D. Wed . "Measuring and predicting the diffraction properties of cylindrically bent potassium acid phthalate, KAP(001), crystals". United States. doi:10.1063/1.4975775.
@article{osti_1348266,
title = {Measuring and predicting the diffraction properties of cylindrically bent potassium acid phthalate, KAP(001), crystals},
author = {Haugh, M. J. and Jacoby, K. D.},
abstractNote = {},
doi = {10.1063/1.4975775},
journal = {Review of Scientific Instruments},
number = 2,
volume = 88,
place = {United States},
year = {Wed Feb 01 00:00:00 EST 2017},
month = {Wed Feb 01 00:00:00 EST 2017}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record at 10.1063/1.4975775

Citation Metrics:
Cited by: 1work
Citation information provided by
Web of Science

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  • This report presents the results from measuring the X-ray resolving power of a curved potassium acid phthalate (KAP(001)) spectrometer crystal using two independent methods. It is part of a continuing effort to measure the fundamental diffraction properties of bent crystals that are used to study various characteristics of high temperature plasmas. Bent crystals like KAP(001) do not usually have the same diffraction properties as corresponding flat crystals. Models that do exist to calculate the effect of bending the crystal on the diffraction properties have simplifying assumptions and their accuracy limits have not been adequately determined. The type of crystals thatmore » we measured is being used in a spectrometer on the Z machine at Sandia National Laboratories in Albuquerque, New Mexico. The first technique for measuring the crystal resolving power measures the X-ray spectral line width of the characteristic lines from several metal anodes. The second method uses a diode X-ray source and a double crystal diffractometer arrangement to measure the reflectivity curve of the KAP(001) crystal. The width of that curve is inversely proportional to the crystal resolving power. The measurement results are analyzed and discussed.« less
  • Various crystals are used for the dispersive component of X-ray spectrometers. The crystals are usually bent to meet the desired measurement needs, such as focusing. The bending can change the crystal diffraction properties, thus altering the spectrometer throughput and resolving power. This work concerns measuring the diffraction properties of a potassium acid phthalate (001) [KAP(001)] crystal bent into a circular cylinder segment. The measurement methods using a diode source and a synchrotron source are described. The multi-lamellar model for calculating the diffraction properties of a bent crystal is described. The measurement results are compared to the multi-lamellar model and showmore » qualitative agreement. The measurements show how to make the multi-lamellar calculations a useful estimate. A method is given to make useful estimates of the diffraction properties of the KAP(001) crystal bent into a circular cylinder segment.« less
  • This report presents the results from measuring the X-ray resolving power of a curved potassium acid phthalate (KAP(001)) spectrometer crystal using two independent methods. It is part of a continuing effort to measure the fundamental diffraction properties of bent crystals that are used to study various characteristics of high temperature plasmas. Bent crystals like KAP(001) do not usually have the same diffraction properties as corresponding flat crystals. Models that do exist to calculate the effect of bending the crystal on the diffraction properties have simplifying assumptions and their accuracy limits have not been adequately determined. The type of crystals thatmore » we measured is being used in a spectrometer on the Z machine at Sandia National Laboratories (SNL) in Albuquerque, NM. The first technique for measuring the crystal resolving power measures the X-ray spectral line width of the characteristic lines from several metal anodes. The second method uses a diode X-ray source and a dual goniometer arrangement to measure the reflectivity curve of the KAP(001) crystal. The width of that curve is inversely proportional to the crystal resolving power. The measurement results are analyzed and discussed.« less
  • The Advanced Light Source beamline-9.3.1 x-rays are used to calibrate the rocking curve of bent potassium acid phthalate (KAP) crystals in the 2.3-4.5 keV photon-energy range. Crystals are bent on a cylindrically convex substrate with a radius of curvature ranging from 2 to 9 in. and also including the flat case to observe the effect of bending on the KAP spectrometric properties. As the bending radius increases, the crystal reflectivity converges to the mosaic crystal response. The X-ray Oriented Programs (XOP) multi-lamellar model of bent crystals is used to model the rocking curve of these crystals and the calibration datamore » confirm that a single model is adequate to reproduce simultaneously all measured integrated reflectivities and rocking-curve FWHM for multiple radii of curvature in both 1st and 2nd order of diffraction.« less