skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Precision mechanical structure of an ultra-high-resolution spectrometer for inelastic X-ray scattering instrument

Abstract

A method and an ultrahigh-resolution spectrometer including a precision mechanical structure for positioning inelastic X-ray scattering optics are provided. The spectrometer includes an X-ray monochromator and an X-ray analyzer, each including X-ray optics of a collimating (C) crystal, a pair of dispersing (D) element crystals, anomalous transmission filter (F) and a wavelength (W) selector crystal. A respective precision mechanical structure is provided with the X-ray monochromator and the X-ray analyzer. The precision mechanical structure includes a base plate, such as an aluminum base plate; positioning stages for D-crystal alignment; positioning stages with an incline sensor for C/F/W-crystal alignment, and the positioning stages including flexure-based high-stiffness structure.

Inventors:
; ; ; ; ;
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1348215
Patent Number(s):
9,008,272
Application Number:
13/551,788
Assignee:
UChicago Argonne, LLC (Chicago, IL) ANL
DOE Contract Number:  
AC02-06CH11357
Resource Type:
Patent
Resource Relation:
Patent File Date: 2012 Jul 18
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; 36 MATERIALS SCIENCE

Citation Formats

Shu, Deming, Shvydko, Yuri, Stoupin, Stanislav A., Khachatryan, Ruben, Goetze, Kurt A., and Roberts, Timothy. Precision mechanical structure of an ultra-high-resolution spectrometer for inelastic X-ray scattering instrument. United States: N. p., 2015. Web.
Shu, Deming, Shvydko, Yuri, Stoupin, Stanislav A., Khachatryan, Ruben, Goetze, Kurt A., & Roberts, Timothy. Precision mechanical structure of an ultra-high-resolution spectrometer for inelastic X-ray scattering instrument. United States.
Shu, Deming, Shvydko, Yuri, Stoupin, Stanislav A., Khachatryan, Ruben, Goetze, Kurt A., and Roberts, Timothy. Tue . "Precision mechanical structure of an ultra-high-resolution spectrometer for inelastic X-ray scattering instrument". United States. doi:. https://www.osti.gov/servlets/purl/1348215.
@article{osti_1348215,
title = {Precision mechanical structure of an ultra-high-resolution spectrometer for inelastic X-ray scattering instrument},
author = {Shu, Deming and Shvydko, Yuri and Stoupin, Stanislav A. and Khachatryan, Ruben and Goetze, Kurt A. and Roberts, Timothy},
abstractNote = {A method and an ultrahigh-resolution spectrometer including a precision mechanical structure for positioning inelastic X-ray scattering optics are provided. The spectrometer includes an X-ray monochromator and an X-ray analyzer, each including X-ray optics of a collimating (C) crystal, a pair of dispersing (D) element crystals, anomalous transmission filter (F) and a wavelength (W) selector crystal. A respective precision mechanical structure is provided with the X-ray monochromator and the X-ray analyzer. The precision mechanical structure includes a base plate, such as an aluminum base plate; positioning stages for D-crystal alignment; positioning stages with an incline sensor for C/F/W-crystal alignment, and the positioning stages including flexure-based high-stiffness structure.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Apr 14 00:00:00 EDT 2015},
month = {Tue Apr 14 00:00:00 EDT 2015}
}

Patent:

Save / Share: