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Title: Dynamic X-ray diffraction imaging of the ferroelectric response in bismuth ferrite

Abstract

In this study, X-ray diffraction imaging is rapidly emerging as a powerful technique by which one can capture the local structure of crystalline materials at the nano- and meso-scale. Here, we present investigations of the dynamic structure of epitaxial monodomain BiFeO 3 thin-films using a novel full-field Bragg diffraction imaging modality. By taking advantage of the depth penetration of hard X-rays and their exquisite sensitivity to the atomic structure, we imaged in situ and in operando, the electric field-driven structural responses of buried BiFeO 3 epitaxial thin-films in micro-capacitor devices, with sub-100 nm lateral resolution. These imaging investigations were carried out at acquisition frame rates that reached up to 20 Hz and data transfer rates of 40 MB/s, while accessing diffraction contrast that is sensitive to the entire three-dimensional unit cell configuration. We mined these large datasets for material responses by employing matrix decomposition techniques, such as independent component analysis. We found that this statistical approach allows the extraction of the salient physical properties of the ferroelectric response of the material, such as coercive fields and transient spatiotemporal modulations in their piezoelectric response, and also facilitates their decoupling from extrinsic sources that are instrument specific.

Authors:
ORCiD logo [1];  [2];  [3];  [2];  [3]
  1. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
  2. Univ. of Wisconsin, Madison, WI (United States)
  3. Argonne National Lab. (ANL), Argonne, IL (United States)
Publication Date:
Research Org.:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS); Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Laboratory Directed Research and Development (LDRD) Program; USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1347466
Alternate Identifier(s):
OSTI ID: 1351788; OSTI ID: 1395861
Grant/Contract Number:  
AC05-00OR22725; AC02-06CH11357
Resource Type:
Journal Article: Published Article
Journal Name:
Advanced Structural and Chemical Imaging
Additional Journal Information:
Journal Volume: 3; Journal Issue: 1; Journal ID: ISSN 2198-0926
Publisher:
Springer
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Laanait, Nouamane, Saenrang, Wittawat, Zhou, Hua, Eom, Chang -Beom, and Zhang, Zhan. Dynamic X-ray diffraction imaging of the ferroelectric response in bismuth ferrite. United States: N. p., 2017. Web. doi:10.1186/s40679-017-0044-3.
Laanait, Nouamane, Saenrang, Wittawat, Zhou, Hua, Eom, Chang -Beom, & Zhang, Zhan. Dynamic X-ray diffraction imaging of the ferroelectric response in bismuth ferrite. United States. doi:10.1186/s40679-017-0044-3.
Laanait, Nouamane, Saenrang, Wittawat, Zhou, Hua, Eom, Chang -Beom, and Zhang, Zhan. Tue . "Dynamic X-ray diffraction imaging of the ferroelectric response in bismuth ferrite". United States. doi:10.1186/s40679-017-0044-3.
@article{osti_1347466,
title = {Dynamic X-ray diffraction imaging of the ferroelectric response in bismuth ferrite},
author = {Laanait, Nouamane and Saenrang, Wittawat and Zhou, Hua and Eom, Chang -Beom and Zhang, Zhan},
abstractNote = {In this study, X-ray diffraction imaging is rapidly emerging as a powerful technique by which one can capture the local structure of crystalline materials at the nano- and meso-scale. Here, we present investigations of the dynamic structure of epitaxial monodomain BiFeO3 thin-films using a novel full-field Bragg diffraction imaging modality. By taking advantage of the depth penetration of hard X-rays and their exquisite sensitivity to the atomic structure, we imaged in situ and in operando, the electric field-driven structural responses of buried BiFeO3 epitaxial thin-films in micro-capacitor devices, with sub-100 nm lateral resolution. These imaging investigations were carried out at acquisition frame rates that reached up to 20 Hz and data transfer rates of 40 MB/s, while accessing diffraction contrast that is sensitive to the entire three-dimensional unit cell configuration. We mined these large datasets for material responses by employing matrix decomposition techniques, such as independent component analysis. We found that this statistical approach allows the extraction of the salient physical properties of the ferroelectric response of the material, such as coercive fields and transient spatiotemporal modulations in their piezoelectric response, and also facilitates their decoupling from extrinsic sources that are instrument specific.},
doi = {10.1186/s40679-017-0044-3},
journal = {Advanced Structural and Chemical Imaging},
number = 1,
volume = 3,
place = {United States},
year = {Tue Mar 21 00:00:00 EDT 2017},
month = {Tue Mar 21 00:00:00 EDT 2017}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record at 10.1186/s40679-017-0044-3

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Works referenced in this record:

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Stabilization of Monodomain Polarization in Ultrathin PbTiO 3 Films
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