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Title: A direct electron detector for time-resolved MeV electron microscopy

Abstract

The introduction of direct electron detectors enabled the structural biology revolution of cryogenic electron microscopy. Direct electron detectors are now expected to have a similarly dramatic impact on time-resolved MeV electron microscopy, particularly by enabling both spatial and temporal jitter correction. Here we report on the commissioning of a direct electron detector for time-resolved MeV electron microscopy. The direct electron detector demonstrated MeV single electron sensitivity and is capable of recording megapixel images at 180 Hz. The detector has a 15-bit dynamic range, better than 30-μmμm spatial resolution and less than 20 analogue-to-digital converter count RMS pixel noise. The unique capabilities of the direct electron detector and the data analysis required to take advantage of these capabilities are presented. The technical challenges associated with generating and processing large amounts of data are also discussed.

Authors:
; ; ; ; ; ; ; ; ; ; ;
Publication Date:
Research Org.:
SLAC National Accelerator Lab., Menlo Park, CA (United States)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
1346528
Report Number(s):
SLAC-PUB-16932
Journal ID: ISSN 0034-6748
DOE Contract Number:  
AC02-76SF00515
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 88; Journal Issue: 3
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; ACCPHY, INST

Citation Formats

Vecchione, T., Denes, P., Jobe, R. K., Johnson, I. J., Joseph, J. M., Li, R. K., Perazzo, A., Shen, X., Wang, X. J., Weathersby, S. P., Yang, J., and Zhang, D. A direct electron detector for time-resolved MeV electron microscopy. United States: N. p., 2017. Web. doi:10.1063/1.4977923.
Vecchione, T., Denes, P., Jobe, R. K., Johnson, I. J., Joseph, J. M., Li, R. K., Perazzo, A., Shen, X., Wang, X. J., Weathersby, S. P., Yang, J., & Zhang, D. A direct electron detector for time-resolved MeV electron microscopy. United States. doi:10.1063/1.4977923.
Vecchione, T., Denes, P., Jobe, R. K., Johnson, I. J., Joseph, J. M., Li, R. K., Perazzo, A., Shen, X., Wang, X. J., Weathersby, S. P., Yang, J., and Zhang, D. Wed . "A direct electron detector for time-resolved MeV electron microscopy". United States. doi:10.1063/1.4977923. https://www.osti.gov/servlets/purl/1346528.
@article{osti_1346528,
title = {A direct electron detector for time-resolved MeV electron microscopy},
author = {Vecchione, T. and Denes, P. and Jobe, R. K. and Johnson, I. J. and Joseph, J. M. and Li, R. K. and Perazzo, A. and Shen, X. and Wang, X. J. and Weathersby, S. P. and Yang, J. and Zhang, D.},
abstractNote = {The introduction of direct electron detectors enabled the structural biology revolution of cryogenic electron microscopy. Direct electron detectors are now expected to have a similarly dramatic impact on time-resolved MeV electron microscopy, particularly by enabling both spatial and temporal jitter correction. Here we report on the commissioning of a direct electron detector for time-resolved MeV electron microscopy. The direct electron detector demonstrated MeV single electron sensitivity and is capable of recording megapixel images at 180 Hz. The detector has a 15-bit dynamic range, better than 30-μmμm spatial resolution and less than 20 analogue-to-digital converter count RMS pixel noise. The unique capabilities of the direct electron detector and the data analysis required to take advantage of these capabilities are presented. The technical challenges associated with generating and processing large amounts of data are also discussed.},
doi = {10.1063/1.4977923},
journal = {Review of Scientific Instruments},
number = 3,
volume = 88,
place = {United States},
year = {Wed Mar 01 00:00:00 EST 2017},
month = {Wed Mar 01 00:00:00 EST 2017}
}