A direct electron detector for time-resolved MeV electron microscopy

Vecchione, T.; Denes, P.; Jobe, R. K.; Johnson, I. J.; Joseph, J. M.; Li, R. K.; Perazzo, A.; Shen, X.; Wang, X. J.; Weathersby, S. P.; Yang, J.; Zhang, D.

doi:10.1063/1.4977923

Title: A direct electron detector for time-resolved MeV electron microscopy

Journal Article · Wed Mar 01 00:00:00 EST 2017 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.4977923· OSTI ID:1346528

Vecchione, T.; Denes, P.; Jobe, R. K.; Johnson, I. J.; Joseph, J. M.; Li, R. K.; Perazzo, A.; Shen, X.; Wang, X. J.; Weathersby, S. P.; Yang, J.; Zhang, D.

The introduction of direct electron detectors enabled the structural biology revolution of cryogenic electron microscopy. Direct electron detectors are now expected to have a similarly dramatic impact on time-resolved MeV electron microscopy, particularly by enabling both spatial and temporal jitter correction. Here we report on the commissioning of a direct electron detector for time-resolved MeV electron microscopy. The direct electron detector demonstrated MeV single electron sensitivity and is capable of recording megapixel images at 180 Hz. The detector has a 15-bit dynamic range, better than 30-μmμm spatial resolution and less than 20 analogue-to-digital converter count RMS pixel noise. The unique capabilities of the direct electron detector and the data analysis required to take advantage of these capabilities are presented. The technical challenges associated with generating and processing large amounts of data are also discussed.

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Research Organization:: SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States)

Sponsoring Organization:: USDOE Office of Science (SC)

DOE Contract Number:: AC02-76SF00515

OSTI ID:: 1346528

Report Number(s):: SLAC-PUB-16932

Journal Information:: Review of Scientific Instruments, Vol. 88, Issue 3; ISSN 0034-6748

Publisher:: American Institute of Physics (AIP)

Country of Publication:: United States

Language:: English

References (24)

Characterisation of a CMOS active pixel sensor for use in the TEAM microscope Battaglia, Marco; Contarato, Devis; Denes, Peter Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 622, Issue 3 https://doi.org/10.1016/j.nima.2010.07.066	journal	October 2010
Development of a new 3 MV ultra-high voltage electron microscope at Osaka University Takaoka, A.; Ura, K.; Mori, H. Journal of Electron Microscopy, Vol. 46, Issue 6 https://doi.org/10.1093/oxfordjournals.jmicro.a023542	journal	January 1997
Achieving few-femtosecond time-sorting at hard X-ray free-electron lasers Harmand, M.; Coffee, R.; Bionta, M. R. Nature Photonics, Vol. 7, Issue 3 https://doi.org/10.1038/nphoton.2013.11	journal	February 2013
Tilted femtosecond pulses for velocity matching in gas-phase ultrafast electron diffraction Zhang, Ping; Yang, Jie; Centurion, Martin New Journal of Physics, Vol. 16, Issue 8 https://doi.org/10.1088/1367-2630/16/8/083008	journal	August 2014
Ultrafast electron diffraction from non-equilibrium phonons in femtosecond laser heated Au films Chase, T.; Trigo, M.; Reid, A. H. Applied Physics Letters, Vol. 108, Issue 4 https://doi.org/10.1063/1.4940981	journal	January 2016
Dynamic Structural Response and Deformations of Monolayer MoS ₂ Visualized by Femtosecond Electron Diffraction Mannebach, Ehren M.; Li, Renkai; Duerloo, Karel-Alexander Nano Letters, Vol. 15, Issue 10 https://doi.org/10.1021/acs.nanolett.5b02805	journal	September 2015
CMOS pixel sensor response to low energy electrons in transmission electron microscopy Battaglia, Marco; Contarato, Devis; Denes, Peter Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 605, Issue 3 https://doi.org/10.1016/j.nima.2009.03.249	journal	July 2009
Electron and X-Ray Methods of Ultrafast Structural Dynamics: Advances and Applications Chergui, Majed; Zewail, Ahmed H. ChemPhysChem, Vol. 10, Issue 1 https://doi.org/10.1002/cphc.200800667	journal	January 2009
Transmission-electron diffraction by MeV electron pulses Murooka, Y.; Naruse, N.; Sakakihara, S. Applied Physics Letters, Vol. 98, Issue 25 https://doi.org/10.1063/1.3602314	journal	June 2011
Direct single electron detection with a CMOS detector for electron microscopy Faruqi, A. R.; Henderson, R.; Pryddetch, M. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 546, Issue 1-2 https://doi.org/10.1016/j.nima.2005.03.023	journal	July 2005
Mega-electron-volt ultrafast electron diffraction at SLAC National Accelerator Laboratory Weathersby, S. P.; Brown, G.; Centurion, M. Review of Scientific Instruments, Vol. 86, Issue 7 https://doi.org/10.1063/1.4926994	journal	July 2015
Thickness-dependent electron–lattice equilibration in laser-excited thin bismuth films Sokolowski-Tinten, K.; Li, R. K.; Reid, A. H. New Journal of Physics, Vol. 17, Issue 11 https://doi.org/10.1088/1367-2630/17/11/113047	journal	November 2015
Diffractive imaging of a rotational wavepacket in nitrogen molecules with femtosecond megaelectronvolt electron pulses Yang, Jie; Guehr, Markus; Vecchione, Theodore Nature Communications, Vol. 7, Issue 1 https://doi.org/10.1038/ncomms11232	journal	April 2016
Femtosecond electron diffraction: heralding the era of atomically resolved dynamics Sciaini, Germán; Miller, R. J. Dwayne Reports on Progress in Physics, Vol. 74, Issue 9 https://doi.org/10.1088/0034-4885/74/9/096101	journal	August 2011
The development of cryo-EM into a mainstream structural biology technique Nogales, Eva Nature Methods, Vol. 13, Issue 1 https://doi.org/10.1038/nmeth.3694	journal	December 2015
Active Pixel Sensors for electron microscopy Denes, P.; Bussat, J. -M.; Lee, Z. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 579, Issue 2 https://doi.org/10.1016/j.nima.2007.05.308	journal	September 2007
Direct detection in Transmission Electron Microscopy with a pitch CMOS pixel sensor Contarato, Devis; Denes, Peter; Doering, Dionisio Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 635, Issue 1 https://doi.org/10.1016/j.nima.2011.01.087	journal	April 2011
A rad-hard CMOS active pixel sensor for electron microscopy Battaglia, Marco; Contarato, Devis; Denes, Peter Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 598, Issue 2 https://doi.org/10.1016/j.nima.2008.09.029	journal	January 2009
Cluster imaging with a direct detection CMOS pixel sensor in Transmission Electron Microscopy Battaglia, Marco; Contarato, Devis; Denes, Peter Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 608, Issue 2 https://doi.org/10.1016/j.nima.2009.07.017	journal	September 2009
Diffractive Imaging of Coherent Nuclear Motion in Isolated Molecules Yang, Jie; Guehr, Markus; Shen, Xiaozhe Physical Review Letters, Vol. 117, Issue 15 https://doi.org/10.1103/PhysRevLett.117.153002	journal	October 2016
Theory and Design of Charged Particle Beams Reiser, Martin WILEY‐VCH Verlag GmbH & Co https://doi.org/10.1002/9783527617623	book	January 1994
Theory and Design of Charged Particle Beams Reiser, Martin; Lee, Edward P. Physics Today, Vol. 48, Issue 6 https://doi.org/10.1063/1.2808068	journal	June 1995
A Rad-hard CMOS Active Pixel Sensor for Electron Microscopy Battaglia, Marco; Contarato, Devis; Denes, Peter arXiv https://doi.org/10.48550/arxiv.0811.2833	text	January 2008
Characterisation of a CMOS Active Pixel Sensor for use in the TEAM Microscope Battaglia, Marco; Contarato, Devis; Denes, Peter arXiv https://doi.org/10.48550/arxiv.1006.2544	text	January 2010

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Time-resolved photoelectron angular distributions from nonadiabatically aligned CO ₂ molecules with SX-FEL at SACLA Minemoto, Shinichirou; Shimada, Hiroyuki; Komatsu, Kazma Journal of Physics Communications, Vol. 2, Issue 11 https://doi.org/10.1088/2399-6528/aaedd3	journal	November 2018
Femtosecond gas-phase mega-electron-volt ultrafast electron diffraction Shen, X.; Nunes, J. P. F.; Yang, J. Structural Dynamics, Vol. 6, Issue 5 https://doi.org/10.1063/1.5120864	journal	September 2019
Theoretical study of ultrafast x-ray photoelectron diffraction from molecules undergoing photodissociation Tsuru, Shota; Fujikawa, Takashi; Stener, Mauro The Journal of Chemical Physics, Vol. 148, Issue 12 https://doi.org/10.1063/1.5019878	journal	March 2018
Liquid-phase mega-electron-volt ultrafast electron diffraction Nunes, J. P. F.; Ledbetter, K.; Lin, M. Structural Dynamics, Vol. 7, Issue 2 https://doi.org/10.1063/1.5144518	journal	March 2020

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