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Title: Results of the 2015 testbeam of a 180 nm AMS High-Voltage CMOS sensor prototype

Journal Article · · Journal of Instrumentation
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  1. Univ. of Geneva (Switzerland). Dept. of Nuclear and Particle Physics (DPNC)
  2. Univ. of Liverpool (United Kingdom). Dept. of Physics
  3. Brookhaven National Lab. (BNL), Upton, NY (United States)
  4. Brookhaven National Lab. (BNL), Upton, NY (United States); Univ. of Science and Technology of China, Hefei (China). Dept. of Modern Physics
  5. Univ. of Bern (Switzerland). Albert Einstein Center for Fundamental Physics and Laboratory for High Energy Physics
  6. Univ. of Geneva (Switzerland). Dept. of Nuclear and Particle Physics (DPNC); Univ. of Liverpool (United Kingdom). Dept. of Physics
  7. Univ. of Geneva (Switzerland). Dept. of Nuclear and Particle Physics (DPNC); European Organization for Nuclear Research (CERN), Geneva (Switzerland)
  8. Karlsruhe Inst. of Technology (KIT) (Germany)
+ Show Author Affiliations

We investigated the active pixel sensors based on the High-Voltage CMOS technology as a viable option for the future pixel tracker of the ATLAS experiment at the High-Luminosity LHC. Our paper reports on the testbeam measurements performed at the H8 beamline of the CERN Super Proton Synchrotron on a High-Voltage CMOS sensor prototype produced in 180 nm AMS technology. These results in terms of tracking efficiency and timing performance, for different threshold and bias conditions, are shown.

Research Organization:
Brookhaven National Lab. (BNL), Upton, NY (United States)
Sponsoring Organization:
USDOE Office of Science (SC), High Energy Physics (HEP)
Grant/Contract Number:
SC00112704
OSTI ID:
1344241
Report Number(s):
BNL-113561-2017-JA; TRN: US1701773
Journal Information:
Journal of Instrumentation, Vol. 11, Issue 07; ISSN 1748-0221
Publisher:
Institute of Physics (IOP)Copyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 4 works
Citation information provided by
Web of Science

References (7)

A novel monolithic pixelated particle detector implemented in high-voltage CMOS technology journal December 2007
Prototype ATLAS IBL modules using the FE-I4A front-end readout chip journal November 2012
The FE-I4 pixel readout integrated circuit
  • Garcia-Sciveres, M.; Arutinov, D.; Barbero, M.
  • Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 636, Issue 1 https://doi.org/10.1016/j.nima.2010.04.101
journal April 2011
ROOT — An object oriented data analysis framework journal April 1997
Synchronized analysis of testbeam data with the Judith software
  • McGoldrick, Garrin; Červ, Matevž; Gorišek, Andrej
  • Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 765 https://doi.org/10.1016/j.nima.2014.05.033
journal November 2014
First test results Of MIMOSA-26, a fast CMOS sensor with integrated zero suppression and digitized output
  • Baudot, J.; Bertolone, G.; Brogna, A.
  • 2009 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC 2009), 2009 IEEE Nuclear Science Symposium Conference Record (NSS/MIC) https://doi.org/10.1109/NSSMIC.2009.5402399
conference October 2009
Radiation hardness studies of neutron irradiated CMOS sensors fabricated in the ams H18 high voltage process journal February 2016

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Development and application of a modular test system for the HV-CMOS pixel sensor R&D of the ATLAS HL-LHC upgrade journal June 2019

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