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Title: Decoupling of superposed textures in an electrically biased piezoceramic with a 100 preferred orientation

Abstract

A method leveraging Rietveld full-pattern texture analysis to decouple induced domain texture from a preferred grain orientation is presented in this paper. The proposed method is demonstrated by determining the induced domain texture in a polar polymorph of 100 oriented 0.91Bi 1/2Na 1/2TiO 3-0.07BaTiO 3-0.02K 0.5Na 0.5NbO 3. Domain textures determined using the present method are compared with results obtained via single peak fitting. Texture determined using single peak fitting estimated more domain alignment than that determined using the Rietveld based method. These results suggest that the combination of grain texture and phase transitions can lead to single peak fitting under or over estimating domain texture. Finally, while demonstrated for a bulk piezoelectric, the proposed method can be applied to quantify domain textures in multi-component systems and thin films.

Authors:
 [1]; ORCiD logo [2];  [3]
  1. North Carolina State Univ., Raleigh, NC (United States). Dept. of Materials Science and Engineering
  2. Purdue Univ., West Lafayette, IN (United States). School of Materials Engineering
  3. Purdue Univ., West Lafayette, IN (United States). School of Materials Engineering; San Francisco State Univ., CA (United States). College of Science and Engineering
Publication Date:
Research Org.:
Purdue Univ., West Lafayette, IN (United States); North Carolina State Univ., Raleigh, NC (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22); National Science Foundation (NSF)
Contributing Org.:
San Francisco State Univ., CA (United States)
OSTI Identifier:
1343543
Alternate Identifier(s):
OSTI ID: 1361778
Grant/Contract Number:  
AC02-06CH11357; DMR 0805022
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Volume: 110; Journal Issue: 6; Journal ID: ISSN 0003-6951
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; thin film texture; Rietveld refinement; piezoelectric materials; polymorphism; sodium; preferred orientation; ferroelectric; ferroelectric/ferroelastic domain texture

Citation Formats

Fancher, Chris M., Blendell, John E., and Bowman, Keith J. Decoupling of superposed textures in an electrically biased piezoceramic with a 100 preferred orientation. United States: N. p., 2017. Web. doi:10.1063/1.4976009.
Fancher, Chris M., Blendell, John E., & Bowman, Keith J. Decoupling of superposed textures in an electrically biased piezoceramic with a 100 preferred orientation. United States. doi:10.1063/1.4976009.
Fancher, Chris M., Blendell, John E., and Bowman, Keith J. Tue . "Decoupling of superposed textures in an electrically biased piezoceramic with a 100 preferred orientation". United States. doi:10.1063/1.4976009. https://www.osti.gov/servlets/purl/1343543.
@article{osti_1343543,
title = {Decoupling of superposed textures in an electrically biased piezoceramic with a 100 preferred orientation},
author = {Fancher, Chris M. and Blendell, John E. and Bowman, Keith J.},
abstractNote = {A method leveraging Rietveld full-pattern texture analysis to decouple induced domain texture from a preferred grain orientation is presented in this paper. The proposed method is demonstrated by determining the induced domain texture in a polar polymorph of 100 oriented 0.91Bi1/2Na1/2TiO3-0.07BaTiO3-0.02K0.5Na0.5NbO3. Domain textures determined using the present method are compared with results obtained via single peak fitting. Texture determined using single peak fitting estimated more domain alignment than that determined using the Rietveld based method. These results suggest that the combination of grain texture and phase transitions can lead to single peak fitting under or over estimating domain texture. Finally, while demonstrated for a bulk piezoelectric, the proposed method can be applied to quantify domain textures in multi-component systems and thin films.},
doi = {10.1063/1.4976009},
journal = {Applied Physics Letters},
number = 6,
volume = 110,
place = {United States},
year = {Tue Feb 07 00:00:00 EST 2017},
month = {Tue Feb 07 00:00:00 EST 2017}
}

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