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Title: PlotData v. 4.47

Abstract

Sandia National Laboratories has developed a computer program to review, reduce and manipulate waveform data. PlotData is designed for post-acquisition waveform data analysis. PlotData is both a post-acquisition and an advanced interactive data analysis environment. PlotData requires unidirectional waveform data with both uniform and discrete time-series measurements. PlotData operates on a National Instruments' LabVIEW™ software platform. Using PlotData, the user can capture waveform data from digitizing oscilloscopes over a GPIB, USB and Ethernet interface from Tektronix, Lecroy or Agilent scopes. PlotData can both import and export several types of binary waveform files including, but not limited to, Tektronix .wmf files, Lecroy.trc files and xy pair ASCIIfiles. Waveform manipulation includes numerous math functions, integration, differentiation, smoothing, truncation, and other specialized data reduction routines such as VISAR, POV, PVDF (Bauer) piezoelectric gauges, and piezoresistive gauges such as carbon manganin pressure gauges.

Authors:
 [1]
  1. Sandia National Laboratories
Publication Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1343421
Report Number(s):
PlotData; 005145MLTPL00
SCR #529.2
DOE Contract Number:
AC04-94AL85000
Resource Type:
Software
Software Revision:
00
Software Package Number:
005145
Software CPU:
MLTPL
Source Code Available:
No
Country of Publication:
United States

Citation Formats

Wackerbarth, David. PlotData v. 4.47. Computer software. Vers. 00. USDOE. 23 Jun. 2016. Web.
Wackerbarth, David. (2016, June 23). PlotData v. 4.47 (Version 00) [Computer software].
Wackerbarth, David. PlotData v. 4.47. Computer software. Version 00. June 23, 2016.
@misc{osti_1343421,
title = {PlotData v. 4.47, Version 00},
author = {Wackerbarth, David},
abstractNote = {Sandia National Laboratories has developed a computer program to review, reduce and manipulate waveform data. PlotData is designed for post-acquisition waveform data analysis. PlotData is both a post-acquisition and an advanced interactive data analysis environment. PlotData requires unidirectional waveform data with both uniform and discrete time-series measurements. PlotData operates on a National Instruments' LabVIEW™ software platform. Using PlotData, the user can capture waveform data from digitizing oscilloscopes over a GPIB, USB and Ethernet interface from Tektronix, Lecroy or Agilent scopes. PlotData can both import and export several types of binary waveform files including, but not limited to, Tektronix .wmf files, Lecroy.trc files and xy pair ASCIIfiles. Waveform manipulation includes numerous math functions, integration, differentiation, smoothing, truncation, and other specialized data reduction routines such as VISAR, POV, PVDF (Bauer) piezoelectric gauges, and piezoresistive gauges such as carbon manganin pressure gauges.},
doi = {},
year = 2016,
month = 6,
note =
}

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  • Abstract not provided.
  • Plot Data collects and saves waveforms from specified digitizers, displays waveform data on the screen with hard copy option, and performs specific waveform data reduction types including but not limited to VISAR.
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  • By means of a literature survey, a comprehensive set of methods was identified for the verification and validation of conventional software. The 153 methods so identified were classified according to their appropriateness for various phases of a developmental life-cycle -- requirements, design, and implementation; the last category was subdivided into two, static testing and dynamic testing methods. The methods were then characterized in terms of eight rating factors, four concerning ease-of-use of the methods and four concerning the methods` power to detect defects. Based on these factors, two measurements were developed to permit quantitative comparisons among methods, a Cost-Benefit Metricmore » and an Effectiveness Metric. The Effectiveness Metric was further refined to provide three different estimates for each method, depending on three classes of needed stringency of V&V (determined by ratings of a system`s complexity and required-integrity). Methods were then rank-ordered for each of the three classes in terms of their overall cost-benefits and effectiveness. The applicability was then assessed of each method for the four identified components of knowledge-based and expert systems, as well as the system as a whole.« less

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