Characterizing Electric Field Exposed P3HT Thin Films Using Polarized-Light Spectroscopies
- Ames Lab. and Iowa State Univ., Ames, IA (United States). Dept. of Chemistry
- Mansoura Univ. (Egypt). Dept. of Physics
- Iowa State Univ., Ames, IA (United States). Dept. of Materials Science and Engineering
P3HT (poly (3-hexylthiophene)) has been widely used as a donor in the active layer in organic photovoltaic devices. Although moderately high-power conversion efficiencies have been achieved with P3HT-based devices, structural details, such as the orientation of polymer units and the extent of H- and J-aggregation are not yet fully understood; and different measures have been taken to control the ordering in the material. One such measure, which we have exploited, is to apply an electric field from a Van de Graaff generator. We used fluorescence (to measure anisotropy instead of polarization, which is more commonly measured) and Raman spectroscopy to characterize the order of P3HT molecules in thin films resulting from the field. We determine preferential orientations of the units in a thin film, consistent with observed hole mobility in thin-film-transistors, and observe that the apparent H-coupling strength changes when the films are exposed to oriented electrical fields during drying.
- Research Organization:
- Ames Lab., Ames, IA (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- Grant/Contract Number:
- AC02-07CH11358; GM915
- OSTI ID:
- 1342911
- Report Number(s):
- IS-J-9143
- Journal Information:
- Macromolecular Chemistry and Physics, Vol. 217, Issue 16; ISSN 1022-1352
- Publisher:
- WileyCopyright Statement
- Country of Publication:
- United States
- Language:
- English
Web of Science
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