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Title: Characterizing Electric Field Exposed P3HT Thin Films Using Polarized-Light Spectroscopies

Abstract

P3HT (poly (3-hexylthiophene)) has been widely used as a donor in the active layer in organic photovoltaic devices. Although moderately high-power conversion efficiencies have been achieved with P3HT-based devices, structural details, such as the orientation of polymer units and the extent of H- and J-aggregation are not yet fully understood; and different measures have been taken to control the ordering in the material. One such measure, which we have exploited, is to apply an electric field from a Van de Graaff generator. We used fluorescence (to measure anisotropy instead of polarization, which is more commonly measured) and Raman spectroscopy to characterize the order of P3HT molecules in thin films resulting from the field. We determine preferential orientations of the units in a thin film, consistent with observed hole mobility in thin-film-transistors, and observe that the apparent H-coupling strength changes when the films are exposed to oriented electrical fields during drying.

Authors:
 [1];  [2];  [1];  [1];  [3];  [1];  [1]
  1. Ames Lab. and Iowa State Univ., Ames, IA (United States). Dept. of Chemistry
  2. Mansoura Univ. (Egypt). Dept. of Physics
  3. Iowa State Univ., Ames, IA (United States). Dept. of Materials Science and Engineering
Publication Date:
Research Org.:
Ames Laboratory (AMES), Ames, IA (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1342911
Report Number(s):
IS-J-9143
Journal ID: ISSN 1022-1352
Grant/Contract Number:  
AC02-07CH11358; GM915
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
Macromolecular Chemistry and Physics
Additional Journal Information:
Journal Volume: 217; Journal Issue: 16; Journal ID: ISSN 1022-1352
Publisher:
Wiley
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY; π-conjugated polymer; electric field; fluorescence anisotropy; P3HT; photovoltaics; polarized Raman spectroscopy

Citation Formats

Bhattacharjee, Ujjal, Elshobaki, Moneim, Santra, Kalyan, Bobbitt, Jonathan M., Chaudhary, Sumit, Smith, Emily A., and Petrich, Jacob W. Characterizing Electric Field Exposed P3HT Thin Films Using Polarized-Light Spectroscopies. United States: N. p., 2016. Web. doi:10.1002/macp.201600113.
Bhattacharjee, Ujjal, Elshobaki, Moneim, Santra, Kalyan, Bobbitt, Jonathan M., Chaudhary, Sumit, Smith, Emily A., & Petrich, Jacob W. Characterizing Electric Field Exposed P3HT Thin Films Using Polarized-Light Spectroscopies. United States. doi:10.1002/macp.201600113.
Bhattacharjee, Ujjal, Elshobaki, Moneim, Santra, Kalyan, Bobbitt, Jonathan M., Chaudhary, Sumit, Smith, Emily A., and Petrich, Jacob W. Thu . "Characterizing Electric Field Exposed P3HT Thin Films Using Polarized-Light Spectroscopies". United States. doi:10.1002/macp.201600113. https://www.osti.gov/servlets/purl/1342911.
@article{osti_1342911,
title = {Characterizing Electric Field Exposed P3HT Thin Films Using Polarized-Light Spectroscopies},
author = {Bhattacharjee, Ujjal and Elshobaki, Moneim and Santra, Kalyan and Bobbitt, Jonathan M. and Chaudhary, Sumit and Smith, Emily A. and Petrich, Jacob W.},
abstractNote = {P3HT (poly (3-hexylthiophene)) has been widely used as a donor in the active layer in organic photovoltaic devices. Although moderately high-power conversion efficiencies have been achieved with P3HT-based devices, structural details, such as the orientation of polymer units and the extent of H- and J-aggregation are not yet fully understood; and different measures have been taken to control the ordering in the material. One such measure, which we have exploited, is to apply an electric field from a Van de Graaff generator. We used fluorescence (to measure anisotropy instead of polarization, which is more commonly measured) and Raman spectroscopy to characterize the order of P3HT molecules in thin films resulting from the field. We determine preferential orientations of the units in a thin film, consistent with observed hole mobility in thin-film-transistors, and observe that the apparent H-coupling strength changes when the films are exposed to oriented electrical fields during drying.},
doi = {10.1002/macp.201600113},
journal = {Macromolecular Chemistry and Physics},
number = 16,
volume = 217,
place = {United States},
year = {Thu Jun 23 00:00:00 EDT 2016},
month = {Thu Jun 23 00:00:00 EDT 2016}
}

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Cited by: 1 work
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