skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Metallic atomically-thin layered silicon epitaxially grown on silicene/ZrB 2

Abstract

We observe a new two-dimensional (2D) silicon crystal, using low energy electron diffraction (LEED) and scanning tunnelling microscopy (STM) and it's formed by depositing additional Si atoms onto spontaneously-formed epitaxial silicene on a ZrB 2 thin film. From scanning tunnelling spectroscopy (STS) studies, we find that this atomically-thin layered silicon has distinctly different electronic properties. Angle resolved photoelectron spectroscopy (ARPES) reveals that, in sharp contrast to epitaxial silicene, the layered silicon exhibits significantly enhanced density of states at the Fermi level resulting from newly formed metallic bands. Furthermore, the 2D growth of this material could allow for direct contacting to the silicene surface and demonstrates the dramatic changes in electronic structure that can occur by the addition of even a single monolayer amount of material in 2D systems.

Authors:
; ; ; ; ; ; ;
Publication Date:
Research Org.:
Brookhaven National Laboratory (BNL), Upton, NY (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1342651
Report Number(s):
BNL-113487-2017-JA
Journal ID: ISSN 2053-1583; R&D Project: 16083/16083; KC0403020
Grant/Contract Number:  
SC00112704
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
2D Materials
Additional Journal Information:
Journal Volume: 4; Journal Issue: 2; Journal ID: ISSN 2053-1583
Publisher:
IOP Publishing
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; silicene; scanning tunnelling microscopy (STM); low energy electron diffraction (LEED); silicon nanostructures

Citation Formats

Gill, Tobias G., Fleurence, Antoine, Warner, Ben, Prüser, Henning, Friedlein, Rainer, Sadowski, Jerzy T., Hirjibehedin, Cyrus F., and Yamada-Takamura, Yukiko. Metallic atomically-thin layered silicon epitaxially grown on silicene/ZrB 2. United States: N. p., 2017. Web. doi:10.1088/2053-1583/aa5a80.
Gill, Tobias G., Fleurence, Antoine, Warner, Ben, Prüser, Henning, Friedlein, Rainer, Sadowski, Jerzy T., Hirjibehedin, Cyrus F., & Yamada-Takamura, Yukiko. Metallic atomically-thin layered silicon epitaxially grown on silicene/ZrB 2. United States. doi:10.1088/2053-1583/aa5a80.
Gill, Tobias G., Fleurence, Antoine, Warner, Ben, Prüser, Henning, Friedlein, Rainer, Sadowski, Jerzy T., Hirjibehedin, Cyrus F., and Yamada-Takamura, Yukiko. Fri . "Metallic atomically-thin layered silicon epitaxially grown on silicene/ZrB 2". United States. doi:10.1088/2053-1583/aa5a80. https://www.osti.gov/servlets/purl/1342651.
@article{osti_1342651,
title = {Metallic atomically-thin layered silicon epitaxially grown on silicene/ZrB 2},
author = {Gill, Tobias G. and Fleurence, Antoine and Warner, Ben and Prüser, Henning and Friedlein, Rainer and Sadowski, Jerzy T. and Hirjibehedin, Cyrus F. and Yamada-Takamura, Yukiko},
abstractNote = {We observe a new two-dimensional (2D) silicon crystal, using low energy electron diffraction (LEED) and scanning tunnelling microscopy (STM) and it's formed by depositing additional Si atoms onto spontaneously-formed epitaxial silicene on a ZrB2 thin film. From scanning tunnelling spectroscopy (STS) studies, we find that this atomically-thin layered silicon has distinctly different electronic properties. Angle resolved photoelectron spectroscopy (ARPES) reveals that, in sharp contrast to epitaxial silicene, the layered silicon exhibits significantly enhanced density of states at the Fermi level resulting from newly formed metallic bands. Furthermore, the 2D growth of this material could allow for direct contacting to the silicene surface and demonstrates the dramatic changes in electronic structure that can occur by the addition of even a single monolayer amount of material in 2D systems.},
doi = {10.1088/2053-1583/aa5a80},
journal = {2D Materials},
number = 2,
volume = 4,
place = {United States},
year = {Fri Feb 17 00:00:00 EST 2017},
month = {Fri Feb 17 00:00:00 EST 2017}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record

Citation Metrics:
Cited by: 2 works
Citation information provided by
Web of Science

Save / Share: