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Title: Rocking curve imaging of high quality sapphire crystals in backscattering geometry

Abstract

Here, we report on the characterization of high quality sapphire single crystals suitable for high-resolution X-ray optics at high energy. Investigations using rocking curve imaging reveal the crystals to be of uniformly good quality at the level of ~10 -4 in lattice parameter variations, deltad/d. But, investigations using backscattering rocking curve imaging with lattice spacing resolution of deltad/d ~ 5.10 -8 shows very diverse quality maps for all crystals. Our results highlight nearly ideal areas with edge length of 0.2-0.5 mm in most crystals, but a comparison of the back re ection peak positions shows that even neighboring ideal areas exhibit a relative difference in the lattice parameters on the order of deltad/d = 10-20.10 -8; this is several times larger than the rocking curve width. Furthermore, the stress-strain analysis suggests that an extremely stringent limit on the strain at a level of ~100 kPa in the growth process is required in order to produce crystals with large areas of the quality required for X-ray optics at high energy.

Authors:
 [1];  [2];  [3];  [4];  [5];  [1];  [6];  [6];  [7];  [1];  [8];  [5];  [9];  [5];  [4];  [10];  [3];  [11]
  1. Julich Research Centre (Germany). Julich Centre for Neutron Science (JCNS)
  2. (ESRF), Grenoble (France)
  3. (Belgium). Faculty of Sciences
  4. Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany)
  5. European Synchrotron Radiation Facility (ESRF), Grenoble (France)
  6. Shubnikov Inst. of Crystallography, Moscow (Russia)
  7. (Russia)
  8. DESY; Germany
  9. (South Africa). Dept. of Physics
  10. ulich Research Centre (Germany). Julich Centre for Neutron Science (JCNS)
  11. (ORNL), Oak Ridge, TN (United States). Materials Science and Technology Division
Publication Date:
Research Org.:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1341570
Grant/Contract Number:  
AC05-00OR22725
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
Journal of Applied Physics
Additional Journal Information:
Journal Volume: 121; Journal Issue: 4; Journal ID: ISSN 0021-8979
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Jafari, A., European Synchrotron Radiation Facility, Univ. of Liege,, Sergueev, I., Bessas, D., Klobes, B., Roschin, B. S., Asadchikov, V. E., Lomonosov Moscow State Univ., Moscow, Alexeev, P., Deutsches Elektronen-Synchrotron, Hamburg, Härtwig, J., Univ. of Johannesburg, Chumakov, A. I., Wille, H. -C., Hermann, R. P., Univ. of Liege,, and Oak Ridge National Lab. Rocking curve imaging of high quality sapphire crystals in backscattering geometry. United States: N. p., 2017. Web. doi:10.1063/1.4974106.
Jafari, A., European Synchrotron Radiation Facility, Univ. of Liege,, Sergueev, I., Bessas, D., Klobes, B., Roschin, B. S., Asadchikov, V. E., Lomonosov Moscow State Univ., Moscow, Alexeev, P., Deutsches Elektronen-Synchrotron, Hamburg, Härtwig, J., Univ. of Johannesburg, Chumakov, A. I., Wille, H. -C., Hermann, R. P., Univ. of Liege,, & Oak Ridge National Lab. Rocking curve imaging of high quality sapphire crystals in backscattering geometry. United States. doi:10.1063/1.4974106.
Jafari, A., European Synchrotron Radiation Facility, Univ. of Liege,, Sergueev, I., Bessas, D., Klobes, B., Roschin, B. S., Asadchikov, V. E., Lomonosov Moscow State Univ., Moscow, Alexeev, P., Deutsches Elektronen-Synchrotron, Hamburg, Härtwig, J., Univ. of Johannesburg, Chumakov, A. I., Wille, H. -C., Hermann, R. P., Univ. of Liege,, and Oak Ridge National Lab. Mon . "Rocking curve imaging of high quality sapphire crystals in backscattering geometry". United States. doi:10.1063/1.4974106. https://www.osti.gov/servlets/purl/1341570.
@article{osti_1341570,
title = {Rocking curve imaging of high quality sapphire crystals in backscattering geometry},
author = {Jafari, A. and European Synchrotron Radiation Facility and Univ. of Liege, and Sergueev, I. and Bessas, D. and Klobes, B. and Roschin, B. S. and Asadchikov, V. E. and Lomonosov Moscow State Univ., Moscow and Alexeev, P. and Deutsches Elektronen-Synchrotron, Hamburg and Härtwig, J. and Univ. of Johannesburg and Chumakov, A. I. and Wille, H. -C. and Hermann, R. P. and Univ. of Liege, and Oak Ridge National Lab.},
abstractNote = {Here, we report on the characterization of high quality sapphire single crystals suitable for high-resolution X-ray optics at high energy. Investigations using rocking curve imaging reveal the crystals to be of uniformly good quality at the level of ~10-4 in lattice parameter variations, deltad/d. But, investigations using backscattering rocking curve imaging with lattice spacing resolution of deltad/d ~ 5.10-8 shows very diverse quality maps for all crystals. Our results highlight nearly ideal areas with edge length of 0.2-0.5 mm in most crystals, but a comparison of the back re ection peak positions shows that even neighboring ideal areas exhibit a relative difference in the lattice parameters on the order of deltad/d = 10-20.10-8; this is several times larger than the rocking curve width. Furthermore, the stress-strain analysis suggests that an extremely stringent limit on the strain at a level of ~100 kPa in the growth process is required in order to produce crystals with large areas of the quality required for X-ray optics at high energy.},
doi = {10.1063/1.4974106},
journal = {Journal of Applied Physics},
number = 4,
volume = 121,
place = {United States},
year = {Mon Jan 23 00:00:00 EST 2017},
month = {Mon Jan 23 00:00:00 EST 2017}
}

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Works referenced in this record:

Fabrication of diffraction gratings for hard X-ray phase contrast imaging
journal, May 2007

  • David, C.; Bruder, J.; Rohbeck, T.
  • Microelectronic Engineering, Vol. 84, Issue 5-8, p. 1172-1177
  • DOI: 10.1016/j.mee.2007.01.151