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Title: Contact-independent electrical conductance measurement

Abstract

Electrical conductance measurement system including a one-dimensional semiconducting channel, with electrical conductance sensitive to electrostatic fluctuations, in a circuit for measuring channel electrical current. An electrically-conductive element is disposed at a location at which the element is capacitively coupled to the channel; a midpoint of the element aligned with about a midpoint of the channel, and connected to first and second electrically-conductive contact pads that are together in a circuit connected to apply a changing voltage across the element. The electrically-conductive contact pads are laterally spaced from the midpoint of the element by a distance of at least about three times a screening length of the element, given in SI units as (K.di-elect cons..sub.0/e.sup.2D(E.sub.F)).sup.1/2, where K is the static dielectric constant, .di-elect cons..sub.0 is the permittivity of free space, e is electron charge, and D(E.sub.F) is the density of states at the Fermi energy for the element.

Inventors:
; ; ;
Publication Date:
Research Org.:
Massachusetts Institute of Technology, Cambridge, MA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1340576
Patent Number(s):
9,551,736
Application Number:
13/570,556
Assignee:
Massachusetts Institute of Technology (Cambridge, MA) CHO
DOE Contract Number:  
FG02-08ER46515
Resource Type:
Patent
Resource Relation:
Patent File Date: 2012 Aug 09
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS

Citation Formats

Mentzel, Tamar S., MacLean, Kenneth, Kastner, Marc A., and Ray, Nirat. Contact-independent electrical conductance measurement. United States: N. p., 2017. Web.
Mentzel, Tamar S., MacLean, Kenneth, Kastner, Marc A., & Ray, Nirat. Contact-independent electrical conductance measurement. United States.
Mentzel, Tamar S., MacLean, Kenneth, Kastner, Marc A., and Ray, Nirat. Tue . "Contact-independent electrical conductance measurement". United States. https://www.osti.gov/servlets/purl/1340576.
@article{osti_1340576,
title = {Contact-independent electrical conductance measurement},
author = {Mentzel, Tamar S. and MacLean, Kenneth and Kastner, Marc A. and Ray, Nirat},
abstractNote = {Electrical conductance measurement system including a one-dimensional semiconducting channel, with electrical conductance sensitive to electrostatic fluctuations, in a circuit for measuring channel electrical current. An electrically-conductive element is disposed at a location at which the element is capacitively coupled to the channel; a midpoint of the element aligned with about a midpoint of the channel, and connected to first and second electrically-conductive contact pads that are together in a circuit connected to apply a changing voltage across the element. The electrically-conductive contact pads are laterally spaced from the midpoint of the element by a distance of at least about three times a screening length of the element, given in SI units as (K.di-elect cons..sub.0/e.sup.2D(E.sub.F)).sup.1/2, where K is the static dielectric constant, .di-elect cons..sub.0 is the permittivity of free space, e is electron charge, and D(E.sub.F) is the density of states at the Fermi energy for the element.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2017},
month = {1}
}

Patent:

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Works referenced in this record:

The Effect of Electrostatic Screening on a Nanometer Scale Electrometer
journal, January 2011

  • MacLean, Kenneth; Mentzel, Tamar S.; Kastner, Marc A.
  • Nano Letters, Vol. 11, Issue 1, p. 30-34
  • DOI: 10.1021/nl102121e

Measuring Charge Transport in a Thin Solid Film Using Charge Sensing
journal, March 2010

  • MacLean, Kenneth; Mentzel, Tamar S.; Kastner, Marc A.
  • Nano Letters, Vol. 10, Issue 3, p. 1037-1040
  • DOI: 10.1021/nl904280q

Contact-Independent Measurement of Electrical Conductance of a Thin Film with a Nanoscale Sensor
journal, October 2011

  • Mentzel, Tamar S.; MacLean, Kenneth; Kastner, Marc A.
  • Nano Letters, Vol. 11, Issue 10, p. 4102-4106
  • DOI: 10.1021/nl201650u