Towards 10 meV resolution: The design of an ultrahigh resolution soft X-ray RIXS spectrometer

Dvorak, Joseph; Jarrige, Ignace; Bisogni, Valentina; Coburn, Scott; Leonhardt, William

doi:10.1063/1.4964847

Title: Towards 10 meV resolution: The design of an ultrahigh resolution soft X-ray RIXS spectrometer

Journal Article · Thu Nov 10 00:00:00 EST 2016 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.4964847· OSTI ID:1340411

Dvorak, Joseph ^[1]; Jarrige, Ignace ^[1]; Bisogni, Valentina ^[1]; Coburn, Scott ^[1]; Leonhardt, William ^[1]

Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source II (NSLS-II)

Here we present the optical design of the Centurion soft X-ray resonant inelastic X-ray scattering (RIXS) spectrometer to be located on the SIX beamline at NSLS-II. The spectrometer is designed to reach a resolving power of 100 000 at 1000 eV at its best resolution. It is also designed to have continuously variable 2θ motion over a range of 112° using a custom triple rotating flange. We have analyzed several possible spectrometer designs capable of reaching the target resolution. After careful analysis, we have adopted a Hettrick-Underwood spectrometer design, with an additional plane mirror to maintain a fixed direction for the outgoing beam. The spectrometer can cancel defocus and coma aberrations at all energies, has an erect focal plane, and minimizes mechanical motions of the detector. When the beamline resolution is accounted for, the net spectral resolution will be 14 meV at 1000 eV. Lastly, this will open up many low energy excitations to study and will expand greatly the power of soft X-ray RIXS.

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Research Organization:: Brookhaven National Laboratory (BNL), Upton, NY (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: SC0012704; AC02-98CH10886

OSTI ID:: 1340411

Alternate ID(s):: OSTI ID: 1331715

Report Number(s):: BNL-113224-2016-JA; RSINAK; TRN: US1701265

Journal Information:: Review of Scientific Instruments, Vol. 87, Issue 11; ISSN 0034-6748

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 41 works

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