skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Nm-scale spatial resolution x-ray imaging with MLL nanofocusing optics: instrumentational requirements and challenges

Abstract

The Hard X-ray Nanoprobe (HXN) beamline at NSLS-II has been designed and constructed to enable imaging experiments with unprecedented spatial resolution and detection sensitivity. The HXN X-ray Microscope is a key instrument for the beamline, providing a suite of experimental capabilities which includes scanning fluorescence, diffraction, differential phase contrast and ptychography utilizing Multilayer Laue Lenses (MLL) and zoneplate (ZP) as nanofocusing optics. In this paper, we present technical requirements for the MLL-based scanning microscope, outline the development concept and present first ~15 x 15 nm 2 spatial resolution x-ray fluorescence images.

Authors:
 [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [2];  [2];  [1]
  1. Brookhaven National Lab. (BNL), Upton, NY (United States)
  2. Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source
Publication Date:
Research Org.:
Brookhaven National Lab. (BNL), Upton, NY (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
Contributing Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
OSTI Identifier:
1340392
Report Number(s):
BNL-112622-2016-JA
DOE Contract Number:
SC0012704; AC02-98CH10886
Resource Type:
Technical Report
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

Citation Formats

Nazaretski, E., Yan, H., Lauer, K., Huang, X., Xu, W., Kalbfleisch, S., Yan, Hui, Li, Li, Bouet, N., Zhou, J., Shu, D., Conley, R., and Chu, Y. S. Nm-scale spatial resolution x-ray imaging with MLL nanofocusing optics: instrumentational requirements and challenges. United States: N. p., 2016. Web. doi:10.2172/1340392.
Nazaretski, E., Yan, H., Lauer, K., Huang, X., Xu, W., Kalbfleisch, S., Yan, Hui, Li, Li, Bouet, N., Zhou, J., Shu, D., Conley, R., & Chu, Y. S. Nm-scale spatial resolution x-ray imaging with MLL nanofocusing optics: instrumentational requirements and challenges. United States. doi:10.2172/1340392.
Nazaretski, E., Yan, H., Lauer, K., Huang, X., Xu, W., Kalbfleisch, S., Yan, Hui, Li, Li, Bouet, N., Zhou, J., Shu, D., Conley, R., and Chu, Y. S. Tue . "Nm-scale spatial resolution x-ray imaging with MLL nanofocusing optics: instrumentational requirements and challenges". United States. doi:10.2172/1340392. https://www.osti.gov/servlets/purl/1340392.
@article{osti_1340392,
title = {Nm-scale spatial resolution x-ray imaging with MLL nanofocusing optics: instrumentational requirements and challenges},
author = {Nazaretski, E. and Yan, H. and Lauer, K. and Huang, X. and Xu, W. and Kalbfleisch, S. and Yan, Hui and Li, Li and Bouet, N. and Zhou, J. and Shu, D. and Conley, R. and Chu, Y. S.},
abstractNote = {The Hard X-ray Nanoprobe (HXN) beamline at NSLS-II has been designed and constructed to enable imaging experiments with unprecedented spatial resolution and detection sensitivity. The HXN X-ray Microscope is a key instrument for the beamline, providing a suite of experimental capabilities which includes scanning fluorescence, diffraction, differential phase contrast and ptychography utilizing Multilayer Laue Lenses (MLL) and zoneplate (ZP) as nanofocusing optics. In this paper, we present technical requirements for the MLL-based scanning microscope, outline the development concept and present first ~15 x 15 nm2 spatial resolution x-ray fluorescence images.},
doi = {10.2172/1340392},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Aug 30 00:00:00 EDT 2016},
month = {Tue Aug 30 00:00:00 EDT 2016}
}

Technical Report:

Save / Share: