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Title: Bragg projection ptychography on niobium phase domain

Abstract

Here, we demonstrate that the highly sensitive phase-contrast properties of Bragg coherent diffraction measurements combined with the translational diversity of ptychography can provide a Bragg “dark field” imaging method capable of revealing the finger print of domain structure in metallic thin films. Experimental diffraction data was taken from a epitaxially grown niobium metallic thin film on sapphire; and analyzed with the help of a careful combination of implemented refinement mechanisms.

Authors:
 [1];  [2];  [3];  [4];  [5];  [6]
  1. Univ. College London, London (United Kingdom)
  2. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
  3. Brookhaven National Lab. (BNL), Upton, NY (United States)
  4. SLAC National Accelerator Lab., Menlo Park, CA (United States); Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany)
  5. Advanced Photon Source, Argonne, IL (United States)
  6. Univ. College London, London (United Kingdom); Research Complex at Harwell, Oxford (United Kingdom)
Publication Date:
Research Org.:
Brookhaven National Lab. (BNL), Upton, NY (United States); SLAC National Accelerator Lab., Menlo Park, CA (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1340350
Alternate Identifier(s):
OSTI ID: 1371499; OSTI ID: 1374382
Report Number(s):
BNL-112069-2016-JA
Journal ID: ISSN 2469-9950
Grant/Contract Number:  
SC00112704; AC02-06CH11357; FG02-11ER46831; AC02-76SF00515; FG02-11DMR-9724294; EP/G068437/1; EP/I022562/1ER46831
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
Physical Review B
Additional Journal Information:
Journal Volume: 96; Journal Issue: 01; Journal ID: ISSN 2469-9950
Publisher:
American Physical Society (APS)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Burdet, Nicolas, Shi, Xiaowen, Huang, Xiaojing, Clark, Jesse N., Harder, Ross, and Robinson, Ian K. Bragg projection ptychography on niobium phase domain. United States: N. p., 2016. Web. doi:10.1103/PhysRevB.96.014109.
Burdet, Nicolas, Shi, Xiaowen, Huang, Xiaojing, Clark, Jesse N., Harder, Ross, & Robinson, Ian K. Bragg projection ptychography on niobium phase domain. United States. doi:10.1103/PhysRevB.96.014109.
Burdet, Nicolas, Shi, Xiaowen, Huang, Xiaojing, Clark, Jesse N., Harder, Ross, and Robinson, Ian K. Wed . "Bragg projection ptychography on niobium phase domain". United States. doi:10.1103/PhysRevB.96.014109. https://www.osti.gov/servlets/purl/1340350.
@article{osti_1340350,
title = {Bragg projection ptychography on niobium phase domain},
author = {Burdet, Nicolas and Shi, Xiaowen and Huang, Xiaojing and Clark, Jesse N. and Harder, Ross and Robinson, Ian K.},
abstractNote = {Here, we demonstrate that the highly sensitive phase-contrast properties of Bragg coherent diffraction measurements combined with the translational diversity of ptychography can provide a Bragg “dark field” imaging method capable of revealing the finger print of domain structure in metallic thin films. Experimental diffraction data was taken from a epitaxially grown niobium metallic thin film on sapphire; and analyzed with the help of a careful combination of implemented refinement mechanisms.},
doi = {10.1103/PhysRevB.96.014109},
journal = {Physical Review B},
number = 01,
volume = 96,
place = {United States},
year = {Wed Aug 10 00:00:00 EDT 2016},
month = {Wed Aug 10 00:00:00 EDT 2016}
}

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Works referenced in this record:

Imaging Local Polarization in Ferroelectric Thin Films by Coherent X-Ray Bragg Projection Ptychography
journal, April 2013

  • Hruszkewycz, S. O.; Highland, M. J.; Holt, M. V.
  • Physical Review Letters, Vol. 110, Issue 17, Article No. 177601
  • DOI: 10.1103/PhysRevLett.110.177601