Structural sensitivity of x-ray Bragg projection ptychography to domain patterns in epitaxial thin films

Hruszkewycz, S. O.; Zhang, Q.; Holt, M. V.; Highland, M. J.; Evans, P. G.; Fuoss, P. H.

doi:10.1103/PhysRevA.94.043803

Title: Structural sensitivity of x-ray Bragg projection ptychography to domain patterns in epitaxial thin films

Journal Article · Tue Oct 04 00:00:00 EDT 2016 · Physical Review A

DOI:https://doi.org/10.1103/PhysRevA.94.043803· OSTI ID:1340002

Hruszkewycz, S. O. ^[1]; Zhang, Q. ^[2]; Holt, M. V. ^[1]; Highland, M. J. ^[1]; Evans, P. G. ^[3]; Fuoss, P. H. ^[1]

Argonne National Lab. (ANL), Argonne, IL (United States)
Univ. of Wisconsin, Madison, WI (United States); Argonne National Lab. (ANL), Argonne, IL (United States)
Univ. of Wisconsin, Madison, WI (United States)

Bragg projection ptychography (BPP) is a coherent diffraction imaging technique capable of mapping the spatial distribution of the Bragg structure factor in nanostructured thin films. Here, we show that, because these images are projections, the structural sensitivity of the resulting images depends on the film thickness and the aspect ratio and orientation of the features of interest and that image interpretation depends on these factors. Lastly, we model changes in contrast in the BPP reconstructions of simulated PbTiO₃ ferroelectric thin films with meandering 180° stripe domains as a function of film thickness, discuss their origin, and comment on the implication of these factors on the design of BPP experiments of general nanostructured films.

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Research Organization:: Argonne National Lab. (ANL), Argonne, IL (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: AC02-06CH11357; FG02-04ER46147

OSTI ID:: 1340002

Alternate ID(s):: OSTI ID: 1328513

Journal Information:: Physical Review A, Vol. 94, Issue 4; ISSN 2469-9926

Publisher:: American Physical Society (APS)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 8 works

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High-resolution three-dimensional structural microscopy by single-angle Bragg ptychography Hruszkewycz, S. O.; Allain, M.; Holt, M. V. Nature Materials, Vol. 16, Issue 2 https://doi.org/10.1038/nmat4798	journal	November 2016
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Bragg projection ptychography on niobium phase domains Burdet, Nicolas; Shi, Xiaowen; Clark, Jesse N. Deutsches Elektronen-Synchrotron, DESY, Hamburg https://doi.org/10.3204/pubdb-2018-00378	text	January 2017

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