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Title: Sodium accumulation at potential-induced degradation shunted areas in polycrystalline silicon modules

Abstract

Here, we investigated potential-induced degradation (PID) in silicon mini-modules that were subjected to accelerated stressing to induce PID conditions. Shunted areas on the cells were identified with photoluminescence and dark lock-in thermography (DLIT) imaging. The identical shunted areas were then analyzed via time-of-flight secondary-ion mass spectrometry (TOFSIMS) imaging, 3-D tomography, and high-resolution transmission electron microscopy. The TOF-SIMS imaging indicates a high concentration of sodium in the shunted areas, and 3-D tomography reveals that the sodium extends more than 2 um from the surface below shunted regions. Transmission electron microscopy investigation reveals that a stacking fault is present at an area identified as shunted by DLIT imaging. After the removal of surface sodium, tomography reveals persistent sodium present around the junction depth of 300 nm and a drastic difference in sodium content at the junction when comparing shunted and nonshunted regions.

Authors:
 [1];  [1];  [1];  [1];  [1];  [1]
  1. National Renewable Energy Lab. (NREL), Golden, CO (United States)
Publication Date:
Research Org.:
National Renewable Energy Lab. (NREL), Golden, CO (United States)
Sponsoring Org.:
USDOE Office of Energy Efficiency and Renewable Energy (EERE), Solar Energy Technologies Office (EE-4S)
OSTI Identifier:
1339517
Report Number(s):
NREL/JA-5K00-65733
Journal ID: ISSN 2156-3381
Grant/Contract Number:  
AC36-08GO28308
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
IEEE Journal of Photovoltaics
Additional Journal Information:
Journal Volume: 6; Journal Issue: 6; Journal ID: ISSN 2156-3381
Publisher:
IEEE
Country of Publication:
United States
Language:
English
Subject:
14 SOLAR ENERGY; 36 MATERIALS SCIENCE; sodium; silicon; tomography; silicon compounds; degradation; accelerated stress; dark lock-in thermography (DLIT); polycrystalline silicon modules; potential-induced degradation (PID); shunting; time-of-flight secondary-ion mass; spectrometry (TOF-SIMS); 3-D tomography

Citation Formats

Harvey, Steven P., Aguiar, Jeffery A., Hacke, Peter, Guthrey, Harvey, Johnston, Steve, and Al-Jassim, Mowafak. Sodium accumulation at potential-induced degradation shunted areas in polycrystalline silicon modules. United States: N. p., 2016. Web. doi:10.1109/JPHOTOV.2016.2601950.
Harvey, Steven P., Aguiar, Jeffery A., Hacke, Peter, Guthrey, Harvey, Johnston, Steve, & Al-Jassim, Mowafak. Sodium accumulation at potential-induced degradation shunted areas in polycrystalline silicon modules. United States. doi:10.1109/JPHOTOV.2016.2601950.
Harvey, Steven P., Aguiar, Jeffery A., Hacke, Peter, Guthrey, Harvey, Johnston, Steve, and Al-Jassim, Mowafak. Mon . "Sodium accumulation at potential-induced degradation shunted areas in polycrystalline silicon modules". United States. doi:10.1109/JPHOTOV.2016.2601950. https://www.osti.gov/servlets/purl/1339517.
@article{osti_1339517,
title = {Sodium accumulation at potential-induced degradation shunted areas in polycrystalline silicon modules},
author = {Harvey, Steven P. and Aguiar, Jeffery A. and Hacke, Peter and Guthrey, Harvey and Johnston, Steve and Al-Jassim, Mowafak},
abstractNote = {Here, we investigated potential-induced degradation (PID) in silicon mini-modules that were subjected to accelerated stressing to induce PID conditions. Shunted areas on the cells were identified with photoluminescence and dark lock-in thermography (DLIT) imaging. The identical shunted areas were then analyzed via time-of-flight secondary-ion mass spectrometry (TOFSIMS) imaging, 3-D tomography, and high-resolution transmission electron microscopy. The TOF-SIMS imaging indicates a high concentration of sodium in the shunted areas, and 3-D tomography reveals that the sodium extends more than 2 um from the surface below shunted regions. Transmission electron microscopy investigation reveals that a stacking fault is present at an area identified as shunted by DLIT imaging. After the removal of surface sodium, tomography reveals persistent sodium present around the junction depth of 300 nm and a drastic difference in sodium content at the junction when comparing shunted and nonshunted regions.},
doi = {10.1109/JPHOTOV.2016.2601950},
journal = {IEEE Journal of Photovoltaics},
number = 6,
volume = 6,
place = {United States},
year = {Mon Sep 19 00:00:00 EDT 2016},
month = {Mon Sep 19 00:00:00 EDT 2016}
}

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