Determination of residual stress in a microtextured α titanium component using high-energy synchrotron X-rays
- Argonne National Lab. (ANL), Lemont, IL (United States)
- McMaster Univ., Hamilton, ON (Canada)
- Cornell Univ., Ithaca, NY (United States)
- Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany)
A shrink-fit sample is manufactured with a Ti-8Al-1Mo-1V alloy to introduce a multiaxial residual stress field in the disk of the sample. A set of strain and orientation pole figures are measured at various locations across the disk using synchrotron high-energy X-ray diffraction. Two approaches—the traditional sin2Ψ method and the bi-scale optimization method—are taken to determine the stresses in the disk based on the measured strain and orientation pole figures, to explore the range of solutions that are possible for the stress field within the disk. While the stress components computed using the sin2Ψ method and the bi-scale optimization method have similar trends, their magnitudes are significantly different. Lastly, it is suspected that the local texture variation in the material is the cause of this discrepancy.
- Research Organization:
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Sponsoring Organization:
- US Air Force Office of Scientific Research (AFOSR); USDOE
- Grant/Contract Number:
- AC02-06CH11357
- OSTI ID:
- 1339303
- Journal Information:
- Journal of Strain Analysis for Engineering Design, Vol. 51, Issue 5; ISSN 0309-3247
- Publisher:
- SAGECopyright Statement
- Country of Publication:
- United States
- Language:
- English
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