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Title: Beam imaging sensor and method for using same

Abstract

The present invention relates generally to the field of sensors for beam imaging and, in particular, to a new and useful beam imaging sensor for use in determining, for example, the power density distribution of a beam including, but not limited to, an electron beam or an ion beam. In one embodiment, the beam imaging sensor of the present invention comprises, among other items, a circumferential slit that is either circular, elliptical or polygonal in nature. In another embodiment, the beam imaging sensor of the present invention comprises, among other things, a discontinuous partially circumferential slit. Also disclosed is a method for using the various beams sensor embodiments of the present invention.

Inventors:
;
Publication Date:
Research Org.:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1338056
Patent Number(s):
9,535,100
Application Number:
14/595,593
Assignee:
BWXT Nuclear Operations Group, Inc. (Lynchburg, VA ORNL
DOE Contract Number:  
AC11-07PN38361
Resource Type:
Patent
Resource Relation:
Patent File Date: 2015 Jan 13
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY

Citation Formats

McAninch, Michael D., and Root, Jeffrey J. Beam imaging sensor and method for using same. United States: N. p., 2017. Web.
McAninch, Michael D., & Root, Jeffrey J. Beam imaging sensor and method for using same. United States.
McAninch, Michael D., and Root, Jeffrey J. Tue . "Beam imaging sensor and method for using same". United States. https://www.osti.gov/servlets/purl/1338056.
@article{osti_1338056,
title = {Beam imaging sensor and method for using same},
author = {McAninch, Michael D. and Root, Jeffrey J.},
abstractNote = {The present invention relates generally to the field of sensors for beam imaging and, in particular, to a new and useful beam imaging sensor for use in determining, for example, the power density distribution of a beam including, but not limited to, an electron beam or an ion beam. In one embodiment, the beam imaging sensor of the present invention comprises, among other items, a circumferential slit that is either circular, elliptical or polygonal in nature. In another embodiment, the beam imaging sensor of the present invention comprises, among other things, a discontinuous partially circumferential slit. Also disclosed is a method for using the various beams sensor embodiments of the present invention.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2017},
month = {1}
}

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