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Title: Sequential X-ray Diffraction Topography at 1-BM X-ray Optics Testing Beamline at the Advanced Photon Source

Authors:
; ; ; ; ; ; ; ; ;
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science - Office of Basic Energy Sciences - Scientific User Facilities Division; Argonne National Laboratory
OSTI Identifier:
1336951
DOE Contract Number:
AC02-06CH11357
Resource Type:
Conference
Resource Relation:
Conference: 12th International Conference on Synchrotron Radiation Instrumentation , 07/06/15 - 07/10/15, New York, NY
Country of Publication:
United States
Language:
English

Citation Formats

Stoupin, Stanislav, Trakhtenberg, Emil, Liu, Zunping, Lang, Keenan, Huang, XianRong, Wieczorek, Michael, Kasman, Elina, Hammonds, John, Macrander, Albert, and Assoufid, Lahsen. Sequential X-ray Diffraction Topography at 1-BM X-ray Optics Testing Beamline at the Advanced Photon Source. United States: N. p., 2016. Web. doi:10.1063/1.4952940.
Stoupin, Stanislav, Trakhtenberg, Emil, Liu, Zunping, Lang, Keenan, Huang, XianRong, Wieczorek, Michael, Kasman, Elina, Hammonds, John, Macrander, Albert, & Assoufid, Lahsen. Sequential X-ray Diffraction Topography at 1-BM X-ray Optics Testing Beamline at the Advanced Photon Source. United States. doi:10.1063/1.4952940.
Stoupin, Stanislav, Trakhtenberg, Emil, Liu, Zunping, Lang, Keenan, Huang, XianRong, Wieczorek, Michael, Kasman, Elina, Hammonds, John, Macrander, Albert, and Assoufid, Lahsen. 2016. "Sequential X-ray Diffraction Topography at 1-BM X-ray Optics Testing Beamline at the Advanced Photon Source". United States. doi:10.1063/1.4952940.
@article{osti_1336951,
title = {Sequential X-ray Diffraction Topography at 1-BM X-ray Optics Testing Beamline at the Advanced Photon Source},
author = {Stoupin, Stanislav and Trakhtenberg, Emil and Liu, Zunping and Lang, Keenan and Huang, XianRong and Wieczorek, Michael and Kasman, Elina and Hammonds, John and Macrander, Albert and Assoufid, Lahsen},
abstractNote = {},
doi = {10.1063/1.4952940},
journal = {},
number = ,
volume = ,
place = {United States},
year = 2016,
month = 7
}

Conference:
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  • We report progress on implementation and commissioning of sequential X-ray diffraction topography at 1-BM Optics Testing Beamline of the Advanced Photon Source to accommodate growing needs of strain characterization in diffractive crystal optics and other semiconductor single crystals. The setup enables evaluation of strain in single crystals in the nearly-nondispersive double-crystal geometry. Si asymmetric collimator crystals of different crystallographic orientations were designed, fabricated and characterized using in-house capabilities. Imaging the exit beam using digital area detectors permits rapid sequential acquisition of X-ray topographs at different angular positions on the rocking curve of a crystal under investigation. Results on sensitivity andmore » spatial resolution are reported based on experiments with high-quality Si and diamond crystals. The new setup complements laboratory-based X-ray topography capabilities of the Optics group at the Advanced Photon Source.« less
  • Beamline 1-BM at the APS has been reconfigured in part for testing of synchrotron optics with both monochromatic and white beams. Operational since 2013, it was reconfigured to accommodate users of the APS as well as users from other DOE facilities. Energies between 6 and 28 keV are available. The beamline was reconfigured to remove two large mirrors and to provide a 100 mm wide monochromatics beam at 54 m from the source. In addition a custom white beam shutter was implemented for topography exposures as short as 65 millisec over the full available horizontal width. Primary agendas include bothmore » white beam and monochromatic beam topography, Talbot grating interferometry, and tests of focusing optics. K-B mirrors, MLLs, and FZPs have been characterized. Measurements of the spatial coherence lengths on the beamline were obtained with Talbot interferometry. Topography data has been reported.« less
  • Projection X-ray topography of single crystals is a classic technique for the evaluation of intrinsic crystal quality of large crystals. In this technique a crystal sample and an area detector (e.g., X-ray film) collecting intensity of a chosen crystallographic reflection are translated simultaneously across an X-ray beam collimated in the diffraction scattering plane (e.g., [1, 2]). A bending magnet beamline of a third-generation synchrotron source delivering x-ray beam with a large horizontal divergence, and therefore, a large horizontal beam size at a crystal sample position offers an opportunity to obtain X-ray topographs of large crystalline samples (e.g., 6-inch wafers) inmore » just a few exposures. Here we report projection X-ray topography system implemented recently at 1-BM beamline of the Advanced Photon Source. A selected X-ray topograph of a 6-inch wafer of 4H-SiC illustrates capabilities and limitations of the technique.« less
  • Cited by 1
  • We developed a portable X-ray grating interferometer setup as a standard tool for testing optics at the Advanced Photon Source (APS) beamline 1-BM. The interferometer can be operated in phase-stepping, Moiré, or single-grating harmonic imaging mode with 1-D or 2-D gratings. All of the interferometer motions are motorized; hence, it is much easier and quicker to switch between the different modes of operation. A novel aspect of this new instrument is its designed portability. While the setup is designed to be primarily used as a standard tool for testing optics at 1-BM, it could be potentially deployed at other APSmore » beamlines for beam coherence and wavefront characterization or imaging. The design of the interferometer system is described in detail and coherence measurements obtained at the APS 34-ID-E beamline are presented. The coherence was probed in two directions using a 2-D checkerboard, a linear, and a circular grating at X-ray energies of 8 keV, 11 keV, and 18 keV.« less