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Title: Dielectric Properties of EC and PC using MD simulations.

Abstract

Abstract not provided.

Authors:
;  [1]; ;  [1]
  1. (Tulane)
Publication Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1334579
Report Number(s):
SAND2015-8841C
614539
DOE Contract Number:  
AC04-94AL85000
Resource Type:
Conference
Resource Relation:
Conference: Proposed for presentation at the ECS annual meeting held October 11-16, 2015 in Phoenix, AZ.
Country of Publication:
United States
Language:
English

Citation Formats

Chaudhari, Mangesh I., Xinli You, Rempe, Susan, and Lawrence Pratt. Dielectric Properties of EC and PC using MD simulations.. United States: N. p., 2015. Web.
Chaudhari, Mangesh I., Xinli You, Rempe, Susan, & Lawrence Pratt. Dielectric Properties of EC and PC using MD simulations.. United States.
Chaudhari, Mangesh I., Xinli You, Rempe, Susan, and Lawrence Pratt. Thu . "Dielectric Properties of EC and PC using MD simulations.". United States. https://www.osti.gov/servlets/purl/1334579.
@article{osti_1334579,
title = {Dielectric Properties of EC and PC using MD simulations.},
author = {Chaudhari, Mangesh I. and Xinli You and Rempe, Susan and Lawrence Pratt},
abstractNote = {Abstract not provided.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2015},
month = {10}
}

Conference:
Other availability
Please see Document Availability for additional information on obtaining the full-text document. Library patrons may search WorldCat to identify libraries that hold this conference proceeding.

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