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Title: Automatic software correction of residual aberrations in reconstructed HRTEM exit waves of crystalline samples

Abstract

We develop an automatic and objective method to measure and correct residual aberrations in atomic-resolution HRTEM complex exit waves for crystalline samples aligned along a low-index zone axis. Our method uses the approximate rotational point symmetry of a column of atoms or single atom to iteratively calculate a best-fit numerical phase plate for this symmetry condition, and does not require information about the sample thickness or precise structure. We apply our method to two experimental focal series reconstructions, imaging a β-Si 3N 4 wedge with O and N doping, and a single-layer graphene grain boundary. We use peak and lattice fitting to evaluate the precision of the corrected exit waves. We also apply our method to the exit wave of a Si wedge retrieved by off-axis electron holography. In all cases, the software correction of the residual aberration function improves the accuracy of the measured exit waves.

Authors:
ORCiD logo [1];  [2];  [3];  [2];  [1]
  1. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
  2. Univ. of California, Berkeley, CA (United States); Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
  3. Corrected Electron Optical Systems GmbH, Heidelberg (Germany)
Publication Date:
Research Org.:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1333886
Alternate Identifier(s):
OSTI ID: 1379634
Grant/Contract Number:  
AC02-05CH11231
Resource Type:
Journal Article: Published Article
Journal Name:
Advanced Structural and Chemical Imaging
Additional Journal Information:
Journal Volume: 2; Journal ID: ISSN 2198-0926
Publisher:
Springer
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 97 MATHEMATICS AND COMPUTING; atomic resolution HRTEM; aberration correction; inline holography; off-axis holography; wavefront sensing

Citation Formats

Ophus, Colin, Rasool, Haider I., Linck, Martin, Zettl, Alex, and Ciston, Jim. Automatic software correction of residual aberrations in reconstructed HRTEM exit waves of crystalline samples. United States: N. p., 2016. Web. doi:10.1186/s40679-016-0030-1.
Ophus, Colin, Rasool, Haider I., Linck, Martin, Zettl, Alex, & Ciston, Jim. Automatic software correction of residual aberrations in reconstructed HRTEM exit waves of crystalline samples. United States. doi:10.1186/s40679-016-0030-1.
Ophus, Colin, Rasool, Haider I., Linck, Martin, Zettl, Alex, and Ciston, Jim. Wed . "Automatic software correction of residual aberrations in reconstructed HRTEM exit waves of crystalline samples". United States. doi:10.1186/s40679-016-0030-1.
@article{osti_1333886,
title = {Automatic software correction of residual aberrations in reconstructed HRTEM exit waves of crystalline samples},
author = {Ophus, Colin and Rasool, Haider I. and Linck, Martin and Zettl, Alex and Ciston, Jim},
abstractNote = {We develop an automatic and objective method to measure and correct residual aberrations in atomic-resolution HRTEM complex exit waves for crystalline samples aligned along a low-index zone axis. Our method uses the approximate rotational point symmetry of a column of atoms or single atom to iteratively calculate a best-fit numerical phase plate for this symmetry condition, and does not require information about the sample thickness or precise structure. We apply our method to two experimental focal series reconstructions, imaging a β-Si3N4 wedge with O and N doping, and a single-layer graphene grain boundary. We use peak and lattice fitting to evaluate the precision of the corrected exit waves. We also apply our method to the exit wave of a Si wedge retrieved by off-axis electron holography. In all cases, the software correction of the residual aberration function improves the accuracy of the measured exit waves.},
doi = {10.1186/s40679-016-0030-1},
journal = {Advanced Structural and Chemical Imaging},
number = ,
volume = 2,
place = {United States},
year = {Wed Nov 30 00:00:00 EST 2016},
month = {Wed Nov 30 00:00:00 EST 2016}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record at 10.1186/s40679-016-0030-1

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Works referenced in this record:

Grains and grain boundaries in single-layer graphene atomic patchwork quilts
journal, January 2011

  • Huang, Pinshane Y.; Ruiz-Vargas, Carlos S.; van der Zande, Arend M.
  • Nature, Vol. 469, Issue 7330, p. 389-392
  • DOI: 10.1038/nature09718