Three Dimensional Variable-Wavelength X-Ray Bragg Coherent Diffraction Imaging

Cha, W.; Ulvestad, A.; Allain, M.; Chamard, V.; Harder, R.; Leake, S. J.; Maser, J.; Fuoss, P. H.; Hruszkewycz, S. O.

doi:10.1103/PhysRevLett.117.225501

Title: Three Dimensional Variable-Wavelength X-Ray Bragg Coherent Diffraction Imaging

Journal Article · Wed Nov 23 00:00:00 EST 2016 · Physical Review Letters

DOI:https://doi.org/10.1103/PhysRevLett.117.225501· OSTI ID:1352631

Cha, W. ^[1]; Ulvestad, A. ^[1]; Allain, M. ^[2]; Chamard, V. ^[2]; Harder, R. ^[3]; Leake, S. J. ^[4]; Maser, J. ^[3]; Fuoss, P. H. ^[1]; Hruszkewycz, S. O. ^[1]

Argonne National Lab. (ANL), Argonne, IL (United States). Materials Science Division
Aix-Marseille Univ., and CNRS/IN2P3, Marseille (France)
Argonne National Lab. (ANL), Argonne, IL (United States). X-ray Science Division
European Synchrotron Radiation Facility (ESRF), Grenoble (France)

Here, we present and demonstrate a formalism by which three-dimensional (3D) Bragg x-ray coherent diffraction imaging (BCDI) can be implemented without moving the sample by scanning the energy of the incident x-ray beam. This capability is made possible by introducing a 3D Fourier transform that accounts for x-ray wavelength variability. We also demonstrate the approach by inverting coherent Bragg diffraction patterns from a gold nanocrystal measured with an x-ray energy scan. Furthermore, variable-wavelength BCDI will expand the breadth of feasible in situ 3D strain imaging experiments towards more diverse materials environments, especially where sample manipulation is difficult.

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Research Organization:: Argonne National Laboratory (ANL), Argonne, IL (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: AC02-06CH11357

OSTI ID:: 1352631

Alternate ID(s):: OSTI ID: 1333338

Journal Information:: Physical Review Letters, Vol. 117, Issue 22; ISSN 0031-9007

Publisher:: American Physical Society (APS)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 24 works

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References (24)

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Cited By (6)

Variable‐Wavelength Quick Scanning Nanofocused X‐Ray Microscopy for In Situ Strain and Tilt Mapping Richard, Marie‐Ingrid; Cornelius, Thomas W.; Lauraux, Florian Small, Vol. 16, Issue 6 https://doi.org/10.1002/smll.201905990	journal	January 2020
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