Finite Element Simulation and X-Ray Microdiffraction Study of Strain Partitioning in a Layered Nanocomposite

Barabash, R. I.; Agarwal, V.; Koric, S.; Jasiuk, I.; Tischler, J. Z.

doi:10.1155/2016/4351347

Title: Finite Element Simulation and X-Ray Microdiffraction Study of Strain Partitioning in a Layered Nanocomposite

Journal Article · Fri Jan 01 00:00:00 EST 2016 · Journal of Crystallography

DOI:https://doi.org/10.1155/2016/4351347· OSTI ID:1332996

Barabash, R. I. ^[1]; Agarwal, V. ^[2]; Koric, S. ^[3];

^[2]; Tischler, J. Z. ^[4]

Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
Mechanical Science and Engineering Department, University of Illinois at Urbana-Champaign, Urbana, IL 61801, USA
Mechanical Science and Engineering Department, University of Illinois at Urbana-Champaign, Urbana, IL 61801, USA; National Center for Supercomputing Applications, University of Illinois at Urbana-Champaign, Urbana, IL 61801, USA
Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439, USA

The depth-dependent strain partitioning across the interfaces in the growth direction of the NiAl/Cr(Mo) nanocomposite between the Cr and NiAl lamellae was directly measured experimentally and simulated using a finite element method (FEM). Depth-resolved X-ray microdiffraction demonstrated that in the as-grown state both Cr and NiAl lamellae grow along the $(111)$ direction with the formation of as-grown distinct residual ~0.16% compressive strains for Cr lamellae and ~0.05% tensile strains for NiAl lamellae. Three-dimensional simulations were carried out using an implicit FEM. First simulation was designed to study residual strains in the composite due to cooling resulting in formation of crystals. Strains in the growth direction were computed and compared to those obtained from the microdiffraction experiments. Second simulation was conducted to understand the combined strains resulting from cooling and mechanical indentation of the composite. Numerical results in the growth direction of crystal were compared to experimental results confirming the experimentally observed trends.

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Research Organization:: Argonne National Laboratory (ANL), Argonne, IL (United States); Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES); National Science Foundation (NSF)

DOE Contract Number:: AC02-06CH11357

OSTI ID:: 1332996

Journal Information:: Journal of Crystallography, Vol. 2016; ISSN 2356-7317

Country of Publication:: United States

Language:: English

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X-ray synchrotron radiation

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