Local Recovery and Failure Masking for Stencil-based Applications at Extreme Scales.

Gamell, Marc; Teranishi, Keita; Heroux, Michael A.; Mayo, Jackson; Kolla, Hemanth; Chen, Jacqueline H.; Parashar, Manish

doi:10.1145/2807591.2807672

Local Recovery and Failure Masking for Stencil-based Applications at Extreme Scales.

Conference · 01 November 2015

DOI:https://doi.org/10.1145/2807591.2807672· OSTI ID:1332855

Gamell, Marc ^[1]; Teranishi, Keita; Heroux, Michael A.; Mayo, Jackson; Kolla, Hemanth; Chen, Jacqueline H.; Parashar, Manish ^[1]

Rutgers U

Abstract not provided.

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Research Organization:: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Oak Ridge Leadership Computing Facility (OLCF); Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)

Sponsoring Organization:: DOE Office of Science; USDOE National Nuclear Security Administration (NNSA)

DOE Contract Number:: AC04-94AL85000;

OSTI ID:: 1332855

Report Number(s):: SAND2015-10051C; 608212

Conference Information:: Proposed for presentation at the The international conference for high performance computing, networking, storage and analysis. held November 15-20, 2015 in Austin, Texas.

Country of Publication:: United States

Language:: English

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