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Title: CHARACTERIZATION OF PRECIPITATES IN CUBIC SILICON CARBIDE IMPLANTED WITH 25Mg+ IONS

Abstract

The aim of this study is to characterize precipitates in Mg+ ion implanted and high-temperature annealed cubic silicon carbide using scanning transmission electron microscopy, electron energy loss spectroscopy and atom probe tomography.

Authors:
; ; ; ; ; ; ;
Publication Date:
Research Org.:
Pacific Northwest National Lab. (PNNL), Richland, WA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1328058
Report Number(s):
PNNL-SA-120391
DOE Contract Number:  
AC05-76RL01830
Resource Type:
Book
Resource Relation:
Related Information: In Fusion Materials Semianual Report for the Period Ending 06/30/2016, 60:72-77. DOE/ER-0313/60
Country of Publication:
United States
Language:
English

Citation Formats

Jiang, Weilin, Spurgeon, Steven R., Liu, Jia, Edwards, Danny J., Schreiber, Daniel K., Henager, Charles H., Kurtz, Richard J., and Wang, Yongqiang. CHARACTERIZATION OF PRECIPITATES IN CUBIC SILICON CARBIDE IMPLANTED WITH 25Mg+ IONS. United States: N. p., 2016. Web.
Jiang, Weilin, Spurgeon, Steven R., Liu, Jia, Edwards, Danny J., Schreiber, Daniel K., Henager, Charles H., Kurtz, Richard J., & Wang, Yongqiang. CHARACTERIZATION OF PRECIPITATES IN CUBIC SILICON CARBIDE IMPLANTED WITH 25Mg+ IONS. United States.
Jiang, Weilin, Spurgeon, Steven R., Liu, Jia, Edwards, Danny J., Schreiber, Daniel K., Henager, Charles H., Kurtz, Richard J., and Wang, Yongqiang. Mon . "CHARACTERIZATION OF PRECIPITATES IN CUBIC SILICON CARBIDE IMPLANTED WITH 25Mg+ IONS". United States. doi:.
@article{osti_1328058,
title = {CHARACTERIZATION OF PRECIPITATES IN CUBIC SILICON CARBIDE IMPLANTED WITH 25Mg+ IONS},
author = {Jiang, Weilin and Spurgeon, Steven R. and Liu, Jia and Edwards, Danny J. and Schreiber, Daniel K. and Henager, Charles H. and Kurtz, Richard J. and Wang, Yongqiang},
abstractNote = {The aim of this study is to characterize precipitates in Mg+ ion implanted and high-temperature annealed cubic silicon carbide using scanning transmission electron microscopy, electron energy loss spectroscopy and atom probe tomography.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Mon Sep 26 00:00:00 EDT 2016},
month = {Mon Sep 26 00:00:00 EDT 2016}
}

Book:
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