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Title: All About PID - Testing and Avoidance in the Field

Abstract

Potential-induced degradation can cause significant power loss in modules if the appropriate precautions are not taken. In the first part of a new series in PV Tech Power on module failure, Peter Hacke and Steve Johnston assess the current state-of-the-art in detecting, avoiding and mitigating the worst effects of PID.

Authors:
;
Publication Date:
Research Org.:
National Renewable Energy Lab. (NREL), Golden, CO (United States)
Sponsoring Org.:
USDOE Office of Energy Efficiency and Renewable Energy (EERE), Solar Energy Technologies Office (EE-4S)
OSTI Identifier:
1326899
Report Number(s):
NREL/JA-5J00-66799
DOE Contract Number:  
AC36-08GO28308
Resource Type:
Journal Article
Resource Relation:
Journal Name: Photovoltaics International; Journal Volume: 33
Country of Publication:
United States
Language:
English
Subject:
14 SOLAR ENERGY; 36 MATERIALS SCIENCE; PID; potential-induced degradation test; IEC 62804-1

Citation Formats

Hacke, Peter, and Johnston, Steve. All About PID - Testing and Avoidance in the Field. United States: N. p., 2016. Web.
Hacke, Peter, & Johnston, Steve. All About PID - Testing and Avoidance in the Field. United States.
Hacke, Peter, and Johnston, Steve. Thu . "All About PID - Testing and Avoidance in the Field". United States. doi:.
@article{osti_1326899,
title = {All About PID - Testing and Avoidance in the Field},
author = {Hacke, Peter and Johnston, Steve},
abstractNote = {Potential-induced degradation can cause significant power loss in modules if the appropriate precautions are not taken. In the first part of a new series in PV Tech Power on module failure, Peter Hacke and Steve Johnston assess the current state-of-the-art in detecting, avoiding and mitigating the worst effects of PID.},
doi = {},
journal = {Photovoltaics International},
number = ,
volume = 33,
place = {United States},
year = {Thu Sep 01 00:00:00 EDT 2016},
month = {Thu Sep 01 00:00:00 EDT 2016}
}