APT mass spectrometry and SEM data for CdTe solar cells

Journal Article · Wed Jun 01 00:00:00 EDT 2016 · Data in Brief

DOI:https://doi.org/10.1016/j.dib.2016.03.042· OSTI ID:1324835

Poplawsky, Jonathan D. ; Li, Chen; Paudel, Naba R.; Guo, Wei; Yan, Yanfa; Pennycook, Stephen J.

Atom probe tomography (APT) data acquired from a CAMECA LEAP 4000 XHR for the CdS/CdTe interface for a non-CdCl₂ treated CdTe solar cell as well as the mass spectrum of an APT data set including a GB in a CdCl₂-treated CdTe solar cell are presented. Scanning electron microscopy (SEM) data showing the evolution of sample preparation for APT and scanning transmission electron microscopy (STEM) electron beam induced current (EBIC) are also presented. As a result, these data show mass spectrometry peak decomposition of Cu and Te within an APT dataset, the CdS/CdTe interface of an untreated CdTe solar cell, preparation of APT needles from the CdS/CdTe interface in superstrate grown CdTe solar cells, and the preparation of a cross-sectional STEM EBIC sample.

• Research Organization: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)
• Sponsoring Organization: USDOE Office of Energy Efficiency and Renewable Energy (EERE); USDOE Laboratory Directed Research and Development (LDRD) Program; USDOE Office of Science (SC)
• Grant/Contract Number: FOA-0000492; AC05-00OR22725
• OSTI ID: 1324835
• Alternate ID(s): OSTI ID: 1261322
• Journal Information: Data in Brief, Journal Name: Data in Brief Vol. 7 Journal Issue: C; ISSN 2352-3409
• Publisher: Elsevier
• Country of Publication: United States
• Language: English

Related Subjects

14 SOLAR ENERGY
36 MATERIALS SCIENCE
scanning electron microscopy
atom probe tomography
mass spectroscopy
solar cells