Imaging via complete cantilever dynamic detection: General dynamic mode imaging and spectroscopy in scanning probe microscopy

Somnath, Suhas; Collins, Liam; Matheson, Michael A.; Sukumar, Sreenivas R.; Kalinin, Sergei V.; Jesse, Stephen

doi:10.1088/0957-4484/27/41/414003

Title: Imaging via complete cantilever dynamic detection: General dynamic mode imaging and spectroscopy in scanning probe microscopy

Journal Article · Thu Sep 08 00:00:00 EDT 2016 · Nanotechnology

DOI:https://doi.org/10.1088/0957-4484/27/41/414003· OSTI ID:1324181

^[1]; Collins, Liam ^[1]; Matheson, Michael A. ^[1]; Sukumar, Sreenivas R. ^[1]; Kalinin, Sergei V. ^[1]; Jesse, Stephen ^[1]

Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)

We develop and implement a multifrequency spectroscopy and spectroscopic imaging mode, referred to as general dynamic mode (GDM), that captures the complete spatially- and stimulus dependent information on nonlinear cantilever dynamics in scanning probe microscopy (SPM). GDM acquires the cantilever response including harmonics and mode mixing products across the entire broadband cantilever spectrum as a function of excitation frequency. GDM spectra substitute the classical measurements in SPM, e.g. amplitude and phase in lock-in detection. Here, GDM is used to investigate the response of a purely capacitively driven cantilever. We use information theory techniques to mine the data and verify the findings with governing equations and classical lock-in based approaches. We explore the dependence of the cantilever dynamics on the tip–sample distance, AC and DC driving bias. This approach can be applied to investigate the dynamic behavior of other systems within and beyond dynamic SPM. In conclusion, GDM is expected to be useful for separating the contribution of different physical phenomena in the cantilever response and understanding the role of cantilever dynamics in dynamic AFM techniques.

View Accepted Manuscript (DOE)

Cite

Export

Save

Research Organization:: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Oak Ridge Leadership Computing Facility (OLCF); Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)

Sponsoring Organization:: USDOE Office of Science (SC)

Grant/Contract Number:: AC05-00OR22725

OSTI ID:: 1324181

Alternate ID(s):: OSTI ID: 1323554

Journal Information:: Nanotechnology, Vol. 27, Issue 41; ISSN 0957-4484

Publisher:: IOP PublishingCopyright Statement

Country of Publication:: United States

Language:: English

References (56)

Atomic Force Microscope Binnig, G.; Quate, C. F.; Gerber, Ch. Physical Review Letters, Vol. 56, Issue 9 https://doi.org/10.1103/PhysRevLett.56.930	journal	March 1986
How the doors to the nanoworld were opened Gerber, Christoph; Lang, Hans Peter Nature Nanotechnology, Vol. 1, Issue 1 https://doi.org/10.1038/nnano.2006.70	journal	October 2006
Dynamic atomic force microscopy methods García, R. Surface Science Reports, Vol. 47, Issue 6-8 https://doi.org/10.1016/S0167-5729(02)00077-8	journal	September 2002
Frequency modulation detection using high‐ Q cantilevers for enhanced force microscope sensitivity Albrecht, T. R.; Grütter, P.; Horne, D. Journal of Applied Physics, Vol. 69, Issue 2 https://doi.org/10.1063/1.347347	journal	January 1991
Kelvin probe force microscopy for potential distribution measurement of semiconductor devices Vatel, Olivier; Tanimoto, Masafumi Journal of Applied Physics, Vol. 77, Issue 6 https://doi.org/10.1063/1.358758	journal	March 1995
Kelvin probe force microscopy Nonnenmacher, M.; O’Boyle, M. P.; Wickramasinghe, H. K. Applied Physics Letters, Vol. 58, Issue 25 https://doi.org/10.1063/1.105227	journal	June 1991
Magnetic dissipation force microscopy Grütter, P.; Liu, Y.; LeBlanc, P. Applied Physics Letters, Vol. 71, Issue 2 https://doi.org/10.1063/1.119519	journal	July 1997
Magnetic imaging by ‘‘force microscopy’’ with 1000 Å resolution Martin, Y.; Wickramasinghe, H. K. Applied Physics Letters, Vol. 50, Issue 20 https://doi.org/10.1063/1.97800	journal	May 1987
Imaging and Control of Domain Structures in Ferroelectric thin Films via Scanning Force Microscopy Gruverman, Alexei; Auciello, Orlando; Tokumoto, Hiroshi Annual Review of Materials Science, Vol. 28, Issue 1 https://doi.org/10.1146/annurev.matsci.28.1.101	journal	August 1998
Mapping nanomechanical properties of live cells using multi-harmonic atomic force microscopy Raman, A.; Trigueros, S.; Cartagena, A. Nature Nanotechnology, Vol. 6, Issue 12 https://doi.org/10.1038/nnano.2011.186	journal	November 2011
Bimodal atomic force microscopy imaging of isolated antibodies in air and liquids Martínez, N. F.; Lozano, J. R.; Herruzo, E. T. Nanotechnology, Vol. 19, Issue 38 https://doi.org/10.1088/0957-4484/19/38/384011	journal	August 2008
An atomic force microscope tip designed to measure time-varying nanomechanical forces Sahin, Ozgur; Magonov, Sergei; Su, Chanmin Nature Nanotechnology, Vol. 2, Issue 8 https://doi.org/10.1038/nnano.2007.226	journal	July 2007
Frequency response of higher cantilever eigenmodes in bimodal and trimodal tapping mode atomic force microscopy Solares, Santiago D.; Chawla, Gaurav Measurement Science and Technology, Vol. 21, Issue 12 https://doi.org/10.1088/0957-0233/21/12/125502	journal	November 2010
Force Microscopy with Light-Atom Probes Hembacher, S. Science, Vol. 305, Issue 5682 https://doi.org/10.1126/science.1099730	journal	July 2004
Bistability, higher harmonics, and chaos in AFM Stark, Robert W. Materials Today, Vol. 13, Issue 9 https://doi.org/10.1016/S1369-7021(10)70162-0	journal	September 2010
The role of nonlinear dynamics in quantitative atomic force microscopy Platz, Daniel; Forchheimer, Daniel; Tholén, Erik A. Nanotechnology, Vol. 23, Issue 26 https://doi.org/10.1088/0957-4484/23/26/265705	journal	June 2012
Cantilever dynamics in atomic force microscopy Raman, Arvind; Melcher, John; Tung, Ryan Nano Today, Vol. 3, Issue 1-2 https://doi.org/10.1016/S1748-0132(08)70012-4	journal	February 2008
Vibrations of free and surface‐coupled atomic force microscope cantilevers: Theory and experiment Rabe, U.; Janser, K.; Arnold, W. Review of Scientific Instruments, Vol. 67, Issue 9 https://doi.org/10.1063/1.1147409	journal	September 1996
State-space model of freely vibrating and surface-coupled cantilever dynamics in atomic force microscopy Stark, Robert W.; Schitter, Georg; Stark, Martin Physical Review B, Vol. 69, Issue 8 https://doi.org/10.1103/PhysRevB.69.085412	journal	February 2004
The emergence of multifrequency force microscopy Garcia, Ricardo; Herruzo, Elena T. Nature Nanotechnology, Vol. 7, Issue 4 https://doi.org/10.1038/nnano.2012.38	journal	April 2012
Intermodulation atomic force microscopy Platz, Daniel; Tholén, Erik A.; Pesen, Devrim Applied Physics Letters, Vol. 92, Issue 15 https://doi.org/10.1063/1.2909569	journal	April 2008
Compositional mapping of surfaces in atomic force microscopy by excitation of the second normal mode of the microcantilever Rodrı́guez, Tomás R.; Garcı́a, Ricardo Applied Physics Letters, Vol. 84, Issue 3 https://doi.org/10.1063/1.1642273	journal	January 2004
Inverting dynamic force microscopy: From signals to time-resolved interaction forces Stark, M.; Stark, R. W.; Heckl, W. M. Proceedings of the National Academy of Sciences, Vol. 99, Issue 13, p. 8473-8478 https://doi.org/10.1073/pnas.122040599	journal	June 2002
Challenges and complexities of multifrequency atomic force microscopy in liquid environments Solares, Santiago D. Beilstein Journal of Nanotechnology, Vol. 5 https://doi.org/10.3762/bjnano.5.33	journal	January 2014
Local thermomechanical characterization of phase transitions using band excitation atomic force acoustic microscopy with heated probe Jesse, S.; Nikiforov, M. P.; Germinario, L. T. Applied Physics Letters, Vol. 93, Issue 7 https://doi.org/10.1063/1.2965470	journal	August 2008
The band excitation method in scanning probe microscopy for rapid mapping of energy dissipation on the nanoscale Jesse, Stephen; Kalinin, Sergei V.; Proksch, Roger Nanotechnology, Vol. 18, Issue 43 https://doi.org/10.1088/0957-4484/18/43/435503	journal	September 2007
Band excitation in scanning probe microscopy: sines of change Jesse, Stephen; Kalinin, Sergei V. Journal of Physics D: Applied Physics, Vol. 44, Issue 46 https://doi.org/10.1088/0022-3727/44/46/464006	journal	November 2011
Half-harmonic Kelvin probe force microscopy with transfer function correction Guo, Senli; Kalinin, Sergei V.; Jesse, Stephen Applied Physics Letters, Vol. 100, Issue 6 https://doi.org/10.1063/1.3684274	journal	February 2012
Single- and Multi-Frequency Detection of Surface Displacements via Scanning Probe Microscopy Romanyuk, Konstantin; Luchkin, Sergey Yu.; Ivanov, Maxim Microscopy and Microanalysis, Vol. 21, Issue 1 https://doi.org/10.1017/S1431927614013622	journal	January 2015
Band Excitation in Scanning Probe Microscopy: Recognition and Functional Imaging Jesse, S.; Vasudevan, R. K.; Collins, L. Annual Review of Physical Chemistry, Vol. 65, Issue 1 https://doi.org/10.1146/annurev-physchem-040513-103609	journal	April 2014
Multifrequency spectrum analysis using fully digital G Mode-Kelvin probe force microscopy Collins, Liam; Belianinov, Alex; Somnath, Suhas Nanotechnology, Vol. 27, Issue 10 https://doi.org/10.1088/0957-4484/27/10/105706	journal	February 2016
Breaking the limits of structural and mechanical imaging of the heterogeneous structure of coal macerals Collins, L.; Tselev, A.; Jesse, S. Nanotechnology, Vol. 25, Issue 43 https://doi.org/10.1088/0957-4484/25/43/435402	journal	October 2014
Probing Local Bias-Induced Transitions Using Photothermal Excitation Contact Resonance Atomic Force Microscopy and Voltage Spectroscopy Li, Qian; Jesse, Stephen; Tselev, Alexander ACS Nano, Vol. 9, Issue 2 https://doi.org/10.1021/nn506753u	journal	January 2015
High speed piezoresponse force microscopy: <1 frame per second nanoscale imaging Nath, Ramesh; Chu, Ying-Hao; Polomoff, Nicholas A. Applied Physics Letters, Vol. 93, Issue 7, Article No. 072905 https://doi.org/10.1063/1.2969045	journal	August 2008
High-resolution characterization of piezoelectric ceramics by ultrasonic scanning force microscopy techniques Rabe, U.; Kopycinska, M.; Hirsekorn, S. Journal of Physics D: Applied Physics, Vol. 35, Issue 20 https://doi.org/10.1088/0022-3727/35/20/323	journal	October 2002
Atomic force acoustic microscopy methods to determine thin-film elastic properties Hurley, D. C.; Shen, K.; Jennett, N. M. Journal of Applied Physics, Vol. 94, Issue 4 https://doi.org/10.1063/1.1592632	journal	August 2003
Complete information acquisition in dynamic force microscopy Belianinov, Alexei; Kalinin, Sergei V.; Jesse, Stephen Nature Communications, Vol. 6, Issue 1 https://doi.org/10.1038/ncomms7550	journal	March 2015
G-mode magnetic force microscopy: Separating magnetic and electrostatic interactions using big data analytics Collins, Liam; Belianinov, Alex; Proksch, Roger Applied Physics Letters, Vol. 108, Issue 19 https://doi.org/10.1063/1.4948601	journal	May 2016
Full information acquisition in piezoresponse force microscopy Somnath, Suhas; Belianinov, Alexei; Kalinin, Sergei V. Applied Physics Letters, Vol. 107, Issue 26 https://doi.org/10.1063/1.4938482	journal	December 2015
Full data acquisition in Kelvin Probe Force Microscopy: Mapping dynamic electric phenomena in real space Collins, Liam; Belianinov, Alex; Somnath, Suhas Scientific Reports, Vol. 6, Issue 1 https://doi.org/10.1038/srep30557	journal	August 2016
Compensating electrostatic forces by single-scan Kelvin probe force microscopy Ziegler, Dominik; Rychen, Jörg; Naujoks, Nicola Nanotechnology, Vol. 18, Issue 22 https://doi.org/10.1088/0957-4484/18/22/225505	journal	May 2007
Open loop Kelvin probe force microscopy with single and multi-frequency excitation Collins, L.; Kilpatrick, J. I.; Weber, S. A. L. Nanotechnology, Vol. 24, Issue 47 https://doi.org/10.1088/0957-4484/24/47/475702	journal	October 2013
Artificial intelligence and pattern recognition techniques in microscope image processing and analysis Bonnet, Noël Advances in Imaging and Electron Physics https://doi.org/10.1016/S1076-5670(00)80020-8	book	January 2000
Multivariate statistical methods for the analysis of microscope image series: applications in materials science Bonnet, N. Journal of Microscopy, Vol. 190, Issue 1‐2 https://doi.org/10.1046/j.1365-2818.1998.3250876.x	journal	April 1998
Principal component and spatial correlation analysis of spectroscopic-imaging data in scanning probe microscopy Jesse, Stephen; Kalinin, Sergei V. Nanotechnology, Vol. 20, Issue 8 https://doi.org/10.1088/0957-4484/20/8/085714	journal	February 2009
New modes for subsurface atomic force microscopy through nanomechanical coupling Tetard, L.; Passian, A.; Thundat, T. Nature Nanotechnology, Vol. 5, Issue 2, p. 105-109 https://doi.org/10.1038/nnano.2009.454	journal	December 2009
Mapping chemical and bonding information using multivariate analysis of electron energy-loss spectrum images Bosman, M.; Watanabe, M.; Alexander, D. T. L. Ultramicroscopy, Vol. 106, Issue 11-12, p. 1024-1032 https://doi.org/10.1016/j.ultramic.2006.04.016	journal	October 2006
A fast randomized algorithm for the approximation of matrices Woolfe, Franco; Liberty, Edo; Rokhlin, Vladimir Applied and Computational Harmonic Analysis, Vol. 25, Issue 3 https://doi.org/10.1016/j.acha.2007.12.002	journal	November 2008
Comparison of photothermal and piezoacoustic excitation methods for frequency and phase modulation atomic force microscopy in liquid environments Labuda, A.; Kobayashi, K.; Kiracofe, D. AIP Advances, Vol. 1, Issue 2 https://doi.org/10.1063/1.3601872	journal	January 2011
Self-driving capacitive cantilevers for high-frequency atomic force microscopy Brown, Keith A.; Yang, Benjamin H.; Westervelt, R. M. Applied Physics Letters, Vol. 100, Issue 5 https://doi.org/10.1063/1.3679684	journal	January 2012
Out-of-plane electrostatic actuation of microcantilevers O’Shea, S. J.; Lu, P.; Shen, F. Nanotechnology, Vol. 16, Issue 4 https://doi.org/10.1088/0957-4484/16/4/045	journal	March 2005
A Capacitive Microcantilever: Modelling, Validation, and Estimation Using Current Measurements Napoli, Mariateresa; Bamieh, Bassam; Turner, Kimberly Journal of Dynamic Systems, Measurement, and Control, Vol. 126, Issue 2 https://doi.org/10.1115/1.1767851	journal	June 2004
Demonstration of Thermomechanical Recording at 641 Gbit/in<tex>$^2$</tex> Pozidis, H.; Haberle, W.; Wiesmann, D. IEEE Transactions on Magnetics, Vol. 40, Issue 4 https://doi.org/10.1109/TMAG.2004.830470	journal	July 2004
Direct actuation of cantilever in aqueous solutions by electrostatic force using high-frequency electric fields Umeda, Ken-ichi; Kobayashi, Kei; Matsushige, Kazumi Applied Physics Letters, Vol. 101, Issue 12 https://doi.org/10.1063/1.4754289	journal	September 2012
Bias controlled capacitive driven cantilever oscillation for high resolution dynamic force microscopy Zhang, Jinjin; Czajkowsky, Daniel M.; Shen, Yi Applied Physics Letters, Vol. 102, Issue 7 https://doi.org/10.1063/1.4793205	journal	February 2013
Viscoelastic Property Mapping with Contact Resonance Force Microscopy Killgore, J. P.; Yablon, D. G.; Tsou, A. H. Langmuir, Vol. 27, Issue 23 https://doi.org/10.1021/la203434w	journal	December 2011

Cited By (3)

Machine Detection of Enhanced Electromechanical Energy Conversion in PbZr _0.2 Ti _0.8 O ₃ Thin Films Agar, Joshua C.; Cao, Ye; Naul, Brett Advanced Materials, Vol. 30, Issue 28 https://doi.org/10.1002/adma.201800701	journal	May 2018
Ultrafast current imaging by Bayesian inversion Somnath, S.; Law, K. J. H.; Morozovska, A. N. Nature Communications, Vol. 9, Issue 1 https://doi.org/10.1038/s41467-017-02455-7	journal	February 2018
Rapid mapping of polarization switching through complete information acquisition Somnath, Suhas; Belianinov, Alex; Kalinin, Sergei V. Nature Communications, Vol. 7, Issue 1 https://doi.org/10.1038/ncomms13290	journal	December 2016

Similar Records

Quantification of surface displacements and electromechanical phenomena via dynamic atomic force microscopy

Journal Article · Thu Sep 15 00:00:00 EDT 2016 · Nanotechnology · OSTI ID:1324181

Balke, Nina; Jesse, Stephen; Yu, Pu; +3 more

High-veracity functional imaging in scanning probe microscopy via Graph-Bootstrapping

Journal Article · Thu Jun 21 00:00:00 EDT 2018 · Nature Communications · OSTI ID:1324181

Li, Xin; Collins, Liam F.; Miyazawa, Keisuke; +3 more

Complete information acquisition in scanning probe microscopy

Journal Article · Fri Mar 13 00:00:00 EDT 2015 · Nature Communications · OSTI ID:1324181

Belianinov, Alex; Kalinin, Sergei V.; Jesse, Stephen

Related Subjects

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
scanning probe microscopy (SPM)
kelving probe force microscopy (KPFM)
electrostatic force microscopy (EFM)
principal component analysis (PCA)
big data
high performance computing (HPC)

Title: Imaging via complete cantilever dynamic detection: General dynamic mode imaging and spectroscopy in scanning probe microscopy

Citation Formats

References (56)

Cited By (3)

Similar Records

Related Subjects