skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Fabrication of quantum dots in undoped Si/Si0.8Ge0.2 heterostructures using a single metal-gate layer

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.4961889· OSTI ID:1320515

Enhancement-mode Si/SiGe electron quantum dots have been pursued extensively by many groups for their potential in quantum computing. Most of the reported dot designs utilize multiple metal-gate layers and use Si/SiGe heterostructures with Ge concentration close to 30%. Here, we report the fabrication and low-temperature characterization of quantum dots in the Si/Si0.8Ge0.2 heterostructures using only one metal-gate layer. We find that the threshold voltage of a channel narrower than 1 μm increases as the width decreases. The higher threshold can be attributed to the combination of quantum confinement and disorder. We also find that the lower Ge ratio used here leads to a narrower operational gate bias range. The higher threshold combined with the limited gate bias range constrains the device design of lithographic quantum dots. We incorporate such considerations in our device design and demonstrate a quantum dot that can be tuned from a single dot to a double dot. Furthermore, the device uses only a single metal-gate layer, greatly simplifying device design and fabrication.

Research Organization:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
Work for Others (WFO); USDOE
Grant/Contract Number:
AC04-94AL85000
OSTI ID:
1320515
Report Number(s):
SAND2016-8268J; APPLAB; 646874
Journal Information:
Applied Physics Letters, Vol. 109, Issue 9; ISSN 0003-6951
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 7 works
Citation information provided by
Web of Science

References (13)

A silicon-based nuclear spin quantum computer journal May 1998
Capacitively induced high mobility two-dimensional electron gas in undoped Si∕Si1−xGex heterostructures with atomic-layer-deposited dielectric journal April 2007
Screening of remote charge scattering sites from the oxide/silicon interface of strained Si two-dimensional electron gases by an intermediate tunable shielding electron layer journal June 2014
A reconfigurable gate architecture for Si/SiGe quantum dots journal June 2015
Quantum control and process tomography of a semiconductor quantum dot hybrid qubit journal July 2014
Electron transport through double quantum dots journal December 2002
Isotopically enhanced triple-quantum-dot qubit journal May 2015
Enhancement-mode buried strained silicon channel quantum dot with tunable lateral geometry journal July 2011
Upper limit of two-dimensional electron density in enhancement-mode Si/SiGe heterostructure field-effect transistors journal October 2011
High-mobility Si and Ge structures journal December 1997
Quantum computation with quantum dots journal January 1998
Silicon quantum electronics journal July 2013
Observation of two-dimensional electron gas in a Si quantum well with mobility of 1.6×106 cm2/Vs journal May 2009

Cited By (4)

Enhancement-mode two-channel triple quantum dot from an undoped Si/Si 0.8 Ge 0.2 quantum well hetero-structure journal June 2018
Quantum dots with split enhancement gate tunnel barrier control journal February 2019
Single and double hole quantum dots in strained Ge/SiGe quantum wells journal March 2019
Single and Double Hole Quantum Dots in Strained Ge/SiGe Quantum Wells text January 2018