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Title: Use of Bayesian Inference in Crystallographic Structure Refinement via Full Diffraction Profile Analysis

Authors:
; ; ; ; ; ; ;
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
Sponsoring Org.:
NSFUNIVERSITY
OSTI Identifier:
1314244
Resource Type:
Journal Article
Resource Relation:
Journal Name: Scientific Reports; Journal Volume: 6; Journal Issue: 2016
Country of Publication:
United States
Language:
ENGLISH

Citation Formats

Fancher, Chris M., Han, Zhen, Levin, Igor, Page, Katharine, Reich, Brian J., Smith, Ralph C., Wilson, Alyson G., and Jones, Jacob L. Use of Bayesian Inference in Crystallographic Structure Refinement via Full Diffraction Profile Analysis. United States: N. p., 2016. Web. doi:10.1038/srep31625.
Fancher, Chris M., Han, Zhen, Levin, Igor, Page, Katharine, Reich, Brian J., Smith, Ralph C., Wilson, Alyson G., & Jones, Jacob L. Use of Bayesian Inference in Crystallographic Structure Refinement via Full Diffraction Profile Analysis. United States. doi:10.1038/srep31625.
Fancher, Chris M., Han, Zhen, Levin, Igor, Page, Katharine, Reich, Brian J., Smith, Ralph C., Wilson, Alyson G., and Jones, Jacob L. Tue . "Use of Bayesian Inference in Crystallographic Structure Refinement via Full Diffraction Profile Analysis". United States. doi:10.1038/srep31625.
@article{osti_1314244,
title = {Use of Bayesian Inference in Crystallographic Structure Refinement via Full Diffraction Profile Analysis},
author = {Fancher, Chris M. and Han, Zhen and Levin, Igor and Page, Katharine and Reich, Brian J. and Smith, Ralph C. and Wilson, Alyson G. and Jones, Jacob L.},
abstractNote = {},
doi = {10.1038/srep31625},
journal = {Scientific Reports},
number = 2016,
volume = 6,
place = {United States},
year = {Tue Aug 23 00:00:00 EDT 2016},
month = {Tue Aug 23 00:00:00 EDT 2016}
}