Generation of Homogeneous and Patterned Electron Beams using a Microlens Array Laser-Shaping Technique

Conference · Wed Jun 01 00:00:00 EDT 2016

DOI:https://doi.org/10.18429/JACoW-IPAC2016-THPOW021· OSTI ID:1294437

Halavanau, Aliaksei ^[1]; Edstrom, Dean ^[2]; Gai, Wei ^[3]; Ha, Gwanghui ^[3]; Piot, Philippe ^[1]; Power, John ^[3]; Qiang, Gao ^[4]; Ruan, Jinhao ^[2]; Santucci, James ^[2]; Wisniewski, Eric ^[3]

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1. NICADD, DeKalb
2. Fermilab
3. Argonne, HEP
4. Unlisted, CN

In photocathodes the achievable electron-beam parameters are controlled by the laser used to trigger the photoemission process. Non-ideal laser distribution hampers the final beam quality. Laser inhomogeneities, for instance, can be "amplified" by space-charge force and result in fragmented electron beams. To overcome this limitation laser shaping methods are routinely employed. In the present paper we demonstrate the use of simple microlens arrays to dramatically improve the transverse uniformity. We also show that this arrangement can be used to produce transversely-patterned electron beams. Our experiments are carried out at the Argonne Wakefield Accelerator facility.

• Research Organization: Fermi National Accelerator Lab. (FNAL), Batavia, IL (United States)
• Sponsoring Organization: USDOE Office of Science (SC), High Energy Physics (HEP)
• DOE Contract Number: AC02-07CH11359
• OSTI ID: 1294437
• Report Number(s): FERMILAB-CONF-16-213-APC; 1470668
• Resource Relation: Conference: 7th International Particle Accelerator Conference, Busan, Korea, 05/08-05/13/2016
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS