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Title: Failure Analysis and Process Improvement for Superconducting Electronics.

Abstract

Abstract not provided.

Authors:
; ; ; ;
Publication Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1291972
Report Number(s):
SAND2015-6643PE
598804
DOE Contract Number:
AC04-94AL85000
Resource Type:
Conference
Resource Relation:
Conference: Proposed for presentation at the IARPA C3 Program Review held August 11-13, 2015 in Boulder, CO.
Country of Publication:
United States
Language:
English

Citation Formats

Missert, Nancy A., Jenkins, Mark W., Tangyunyong, Paiboon, Kotula, Paul G., and Michael, Joseph R. Failure Analysis and Process Improvement for Superconducting Electronics.. United States: N. p., 2015. Web.
Missert, Nancy A., Jenkins, Mark W., Tangyunyong, Paiboon, Kotula, Paul G., & Michael, Joseph R. Failure Analysis and Process Improvement for Superconducting Electronics.. United States.
Missert, Nancy A., Jenkins, Mark W., Tangyunyong, Paiboon, Kotula, Paul G., and Michael, Joseph R. Sat . "Failure Analysis and Process Improvement for Superconducting Electronics.". United States. doi:. https://www.osti.gov/servlets/purl/1291972.
@article{osti_1291972,
title = {Failure Analysis and Process Improvement for Superconducting Electronics.},
author = {Missert, Nancy A. and Jenkins, Mark W. and Tangyunyong, Paiboon and Kotula, Paul G. and Michael, Joseph R.},
abstractNote = {Abstract not provided.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Sat Aug 01 00:00:00 EDT 2015},
month = {Sat Aug 01 00:00:00 EDT 2015}
}

Conference:
Other availability
Please see Document Availability for additional information on obtaining the full-text document. Library patrons may search WorldCat to identify libraries that hold this conference proceeding.

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