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Title: Infrared detector device inspection system

Abstract

Methods and apparatuses for identifying carrier lifetimes are disclosed herein. In a general embodiment, a beam of light is sent to a group of locations on a material for an optical device. Photons emitted from the material are detected at each of the group of locations. A carrier lifetime is identified for each of the group of locations based on the photons detected from each of the group of locations.

Inventors:
;
Publication Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1289555
Patent Number(s):
9,410,900
Application Number:
14/689,167
Assignee:
Sandia Corporation (Albuquerque, NM) SNL-A
DOE Contract Number:
AC04-94AL85000
Resource Type:
Patent
Resource Relation:
Patent File Date: 2015 Apr 17
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS

Citation Formats

Soehnel, Grant, and Bender, Daniel A. Infrared detector device inspection system. United States: N. p., 2016. Web.
Soehnel, Grant, & Bender, Daniel A. Infrared detector device inspection system. United States.
Soehnel, Grant, and Bender, Daniel A. 2016. "Infrared detector device inspection system". United States. doi:. https://www.osti.gov/servlets/purl/1289555.
@article{osti_1289555,
title = {Infrared detector device inspection system},
author = {Soehnel, Grant and Bender, Daniel A.},
abstractNote = {Methods and apparatuses for identifying carrier lifetimes are disclosed herein. In a general embodiment, a beam of light is sent to a group of locations on a material for an optical device. Photons emitted from the material are detected at each of the group of locations. A carrier lifetime is identified for each of the group of locations based on the photons detected from each of the group of locations.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = 2016,
month = 8
}

Patent:

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