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Title: Composition dependence of electronic, magnetic, transport and morphological properties of mixed valence manganite thin films

Abstract

Mixed-valence manganese oxides present striking properties like the colossal magnetoresistance, metal-insulator transition (MIT) that may result from coexistence of ferromagnetic, metallic and insulating phases. Percolation of such phase coexistence in the vicinity of MIT leads to first-order transition in these manganites. However the length scales over which the electronic and magnetic phases are separated across MIT which appears compelling for bulk systems has been elusive in (La 1-yPr y) 1-xCaxMnO 3 films. Here we show the in-plane length scale over which charge and magnetism are correlated in (La 0.4Pr 0.6) 1-xCaxMnO3 films with x = 0.33 and 0.375, across the MIT temperature. We combine electrical transport (resistance) measurements, x-ray absorption spectroscopy (XAS), x-ray magnetic circular dichroism (XMCD), and specular/off-specular x-ray resonant magnetic scattering (XRMS) measurements as a function of temperature to elucidate relationships between electronic, magnetic and morphological structure of the thin films. Using off-specular XRMS we obtained the charge-charge and charge-magnetic correlation length of these LPCMO films across the MIT. We observed different charge-magnetic correlation length for two films which increases below the MIT. The different correlation length shown by two films may be responsible for different macroscopic (transport and magnetic) properties.

Authors:
 [1];  [2];  [3];  [4];  [5]
  1. Bhabha Atomic Research Centre (BARC), Mumbai (India)
  2. Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
  3. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
  4. Univ. of Florida, Gainesville, FL (United States); Pusan National Univ., Busan (Korea, Republic of)
  5. Univ. of Florida, Gainesville, FL (United States)
Publication Date:
Research Org.:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States); Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Laboratory Directed Research and Development (LDRD) Program; National Science Foundation (NSF); USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22). Scientific User Facilities Division
OSTI Identifier:
1286933
Grant/Contract Number:
AC05-00OR22725; AC02-06CH11357
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
Scientific Reports
Additional Journal Information:
Journal Volume: 6; Journal ID: ISSN 2045-2322
Publisher:
Nature Publishing Group
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY

Citation Formats

Singh, Surendra, Freeland, J. W., Fitzsimmons, Michael R., Jeen, H., and Biswas, A. Composition dependence of electronic, magnetic, transport and morphological properties of mixed valence manganite thin films. United States: N. p., 2016. Web. doi:10.1038/srep29632.
Singh, Surendra, Freeland, J. W., Fitzsimmons, Michael R., Jeen, H., & Biswas, A. Composition dependence of electronic, magnetic, transport and morphological properties of mixed valence manganite thin films. United States. doi:10.1038/srep29632.
Singh, Surendra, Freeland, J. W., Fitzsimmons, Michael R., Jeen, H., and Biswas, A. 2016. "Composition dependence of electronic, magnetic, transport and morphological properties of mixed valence manganite thin films". United States. doi:10.1038/srep29632. https://www.osti.gov/servlets/purl/1286933.
@article{osti_1286933,
title = {Composition dependence of electronic, magnetic, transport and morphological properties of mixed valence manganite thin films},
author = {Singh, Surendra and Freeland, J. W. and Fitzsimmons, Michael R. and Jeen, H. and Biswas, A.},
abstractNote = {Mixed-valence manganese oxides present striking properties like the colossal magnetoresistance, metal-insulator transition (MIT) that may result from coexistence of ferromagnetic, metallic and insulating phases. Percolation of such phase coexistence in the vicinity of MIT leads to first-order transition in these manganites. However the length scales over which the electronic and magnetic phases are separated across MIT which appears compelling for bulk systems has been elusive in (La1-yPry)1-xCaxMnO3 films. Here we show the in-plane length scale over which charge and magnetism are correlated in (La0.4Pr0.6)1-xCaxMnO3 films with x = 0.33 and 0.375, across the MIT temperature. We combine electrical transport (resistance) measurements, x-ray absorption spectroscopy (XAS), x-ray magnetic circular dichroism (XMCD), and specular/off-specular x-ray resonant magnetic scattering (XRMS) measurements as a function of temperature to elucidate relationships between electronic, magnetic and morphological structure of the thin films. Using off-specular XRMS we obtained the charge-charge and charge-magnetic correlation length of these LPCMO films across the MIT. We observed different charge-magnetic correlation length for two films which increases below the MIT. The different correlation length shown by two films may be responsible for different macroscopic (transport and magnetic) properties.},
doi = {10.1038/srep29632},
journal = {Scientific Reports},
number = ,
volume = 6,
place = {United States},
year = 2016,
month = 7
}

Journal Article:
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  • Mixed-valence manganese oxides present striking properties like the colossal magnetoresistance, metal-insulator transition (MIT) that may result from coexistence of ferromagnetic, metallic and insulating phases. Percolation of such phase coexistence in the vicinity of MIT leads to first-order transition in these manganites. However the length scales over which the electronic and magnetic phases are separated across MIT which appears compelling for bulk systems has been elusive in (La 1-yPr y) 1-xCa xMnO 3 films. Here we show the in-plane length scale over which charge and magnetism are correlated in (La 0.4Pr 0.6) 1-xCa xMnO 3 films with x=0.33 and 0.375, acrossmore » the MIT temperature. We combine electrical transport (resistance) measurements, x-ray absorption spectroscopy (XAS), x-ray magnetic circular dichroism (XMCD), and specular/off-specular x-ray resonant magnetic scattering (XRMS) measurements as a function of temperature to elucidate relationships between electronic, magnetic and morphological structure of the thin films. Using off-specular XRMS we obtained the charge-charge and charge-magnetic correlation length of these LPCMO films across the MIT. We observed different charge-magnetic correlation length for two films which increases below the MIT. In conclusion, the different correlation length shown by two films may be responsible for different macroscopic (transport and magnetic) properties.« less
  • Here, we present x-ray resonant magnetic dichroism and x-ray resonant magnetic scattering measurements of the temperature dependence of magnetism in Pr-doped La-Ca-Mn-O films grown on (110) NdGaO3 substrates. We observed thermal hysteresis of the ferromagnetism in one film that also showed large thermal hysteresis of ~18K in transport measurements. While in a second film of a different nominal chemistry, which showed very small thermal hysteresis ~3K in transport measurements, no thermal hysteresis of the ferromagnetism was observed. As a result, these macroscopic properties are correlated with evolution of surface magnetization across metal insulator transition for these films as observed bymore » soft x-ray resonant magnetic scattering measurements.« less
  • Here, we present x-ray resonant magnetic dichroism and x-ray resonant magnetic scattering measurements of the temperature dependence of magnetism in Pr-doped La-Ca-Mn-O films grown on (110) NdGaO3 substrates. We observed thermal hysteresis of the ferromagnetism in one film that also showed large thermal hysteresis of similar to 18K in transport measurements. While in a second film of a different nominal chemistry, which showed very small thermal hysteresis similar to 3K in transport measurements, no thermal hysteresis of the ferromagnetism was observed. These macroscopic properties are correlated with evolution of surface magnetization across metal insulator transition for these films as observedmore » by soft x-ray resonant magnetic scattering measurements.« less
  • Here, we present x-ray resonant magnetic dichroism and x-ray resonant magnetic scattering measurements of the temperature dependence of magnetism in Pr-doped La-Ca-Mn-O films grown on (110) NdGaO{sub 3} substrates. We observed thermal hysteresis of the ferromagnetism in one film that also showed large thermal hysteresis of ∼18 K in transport measurements. While in a second film of a different nominal chemistry, which showed very small thermal hysteresis ∼3 K in transport measurements, no thermal hysteresis of the ferromagnetism was observed. These macroscopic properties are correlated with evolution of surface magnetization across metal insulator transition for these films as observed by soft x-raymore » resonant magnetic scattering measurements.« less
  • We have synthesized (110)-oriented epitaxial thin films of the bilayer (n=2) manganite, La{sub 1.2}Sr{sub 1.8}Mn{sub 2}O{sub 7}, with the metallic/ferromagnetic a-b planes lying perpendicular to the substrate surface and the c-axis aligned in the plane of the film. X-ray diffraction and transmission electron microscopy confirm the alignment of the a-b planes along the [1{bar 1}0] substrate direction. The films consist primarily of the n=2 phase with a minor component of the n=1 (La,Sr){sub 2}MnO{sub 4} and n={infinity} (La,Sr)MnO{sub 3} phases. A resistivity maximum coincides with a ferromagnet/paramagnet transition at a reduced T{sub c}{approx}90K (vs. 120K for bulk), indicative of themore » effects of epitaxial strain. The films display similar anisotropic properties to their bulk counterpart with the magnetically easy direction confined to the a-b planes and 20-200 times lower resistivity for current flowing along the a-b planes compared to the c-axis.« less