Non-rigid registration and non-local principle component analysis to improve electron microscopy spectrum images

Yankovich, Andrew B.; Zhang, Chenyu; Oh, Albert; Slater, Thomas J. A.; Azough, Feridoon; Freer, Robert; Haigh, Sarah J.; Willett, Rebecca; Voyles, Paul M.

doi:10.1088/0957-4484/27/36/364001

Title: Non-rigid registration and non-local principle component analysis to improve electron microscopy spectrum images

Journal Article · Mon Aug 01 00:00:00 EDT 2016 · Nanotechnology

DOI:https://doi.org/10.1088/0957-4484/27/36/364001· OSTI ID:1279017

Yankovich, Andrew B.; Zhang, Chenyu; Oh, Albert; Slater, Thomas J. A.; Azough, Feridoon; Freer, Robert; Haigh, Sarah J.; Willett, Rebecca; Voyles, Paul M.

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Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: FG02-08ER46547

OSTI ID:: 1279017

Journal Information:: Nanotechnology, Journal Name: Nanotechnology Vol. 27 Journal Issue: 36; ISSN 0957-4484

Publisher:: IOP PublishingCopyright Statement

Country of Publication:: United Kingdom

Language:: English

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Cited by: 30 works

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