Proton induced electron emission yields from an {open_quote}ideal{close_quote} polycrystalline copper surface
For many decades, efforts have been made to measure the absolute ion induced electron emission (IIEE) yields, y, the number of emitted electrons per incident ion, for protons on elemental metals. One of the most widely studied surfaces has been polycrystalline copper. New measurements for the IIEE yield from polycrystalline copper samples following annealing (T=390{degrees}C) and light sputtering ({approximately} 10{sup 14} ions/cm{sup 2}) have been made. The yield was found to be 1.58 {plus_minus} 0.01 e/ion. This is 10% lower than the most widely published values for y which were obtained from heavily sputtered and unannealed samples. The reduced yield found in the present study is attributed to the absence of significant sputter-induced surface damage.
- OSTI ID:
- 127875
- Report Number(s):
- CONF-920376-; ISSN 0003-0503; TRN: 96:000337
- Journal Information:
- Bulletin of the American Physical Society, Vol. 37, Issue 9; Conference: Meeting of the American Physical Society, Indianapolis, IN (United States), 16-20 Mar 1992; Other Information: PBD: Dec 1992
- Country of Publication:
- United States
- Language:
- English
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