Electron yield XAFS study of evaporated Co/Pd multilayers with various thickness ratios of Co to Pd sublayers: Simulations of the Co K-edge XAFS and fourier transforms
Electron-yield XAFS measurements using the NSLS were made on e-beam evaporated Co/Pd multilayers with various sublayer thicknesses and different thickness ratios of Co to Pd sublayers. The Co K-edge and the Pd K-edge XAFS data were obtained for the Co/Pd multilayers with sublayer thicknesses of 3[Angstrom]/ 4[Angstrom], 15[Angstrom]/4[Angstrom], 3[Angstrom]/15[Angstrom], 2.1[Angstrom]/13.5[Angstrom], and 2.2[Angstrom]/4.5[Angstrom]. Fourier transforms of Co K XAFS for most samples show a splitting of major peak, and the magnitude ratio of these split peaks varies systematically with the thickness ratio of the Pd sublayer to the Co sublayer, whereas the Fourier transforms of the Pd K XAFS for themore »