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Title: Development and calibration of mirrors and gratings for the Soft X-ray materials science beamline at the Linac Coherent Light Source free-electron laser

Journal Article · · Applied Optics
DOI:https://doi.org/10.1364/AO.51.002118· OSTI ID:1266687
 [1];  [2];  [1];  [1];  [3];  [4];  [3];  [3];  [5];  [5]
  1. Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
  2. Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States); Consejo Superior de Investigaciones Cientificas, Madrid (Spain)
  3. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
  4. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States); SLAC National Accelerator Lab., Menlo Park, CA (United States)
  5. SLAC National Accelerator Lab., Menlo Park, CA (United States)

This article discusses the development and calibration of the x-ray reflective and diffractive elements for the Soft X-ray Materials Science (SXR) beamline of the Linac Coherent Light Source (LCLS) free-electron laser (FEL), designed for operation in the 500 – 2000 eV region. The surface topography of three Si mirror substrates and two Si diffraction grating substrates was examined by atomic force microscopy (AFM) and optical profilometry. The figure of the mirror substrates was also verified via surface slope measurements with a long trace profiler. A boron carbide (B4C) coating especially optimized for the LCLS FEL conditions was deposited on all SXR mirrors and gratings. Coating thickness uniformity of 0.14 nm root mean square (rms) across clear apertures extending to 205 mm length was demonstrated for all elements, as required to preserve the coherent wavefront of the LCLS source. The reflective performance of the mirrors and the diffraction efficiency of the gratings were calibrated at beamline 6.3.2 at the Advanced Light Source synchrotron. To verify the integrity of the nanometer-scale grating structure, the grating topography was examined by AFM before and after coating. This is to our knowledge the first time B4C-coated diffraction gratings are demonstrated for operation in the soft x-ray region.

Research Organization:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Organization:
USDOE
Grant/Contract Number:
AC52-07NA27344
OSTI ID:
1266687
Report Number(s):
LLNL-JRNL-516876
Journal Information:
Applied Optics, Vol. 51, Issue 12; ISSN 1559-128X
Publisher:
Optical Society of AmericaCopyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 18 works
Citation information provided by
Web of Science

References (18)

Predicting the coherent X-ray wavefront focal properties at the Linac Coherent Light Source (LCLS) X-ray free electron laser journal January 2009
Linac Coherent Light Source soft x-ray materials science instrument optical design and monochromator commissioning journal September 2011
Morphology, microstructure, stress and damage properties of thin film coatings for the LCLS x-ray mirrors conference May 2009
Recent developments in EUV reflectometry at the Advanced Light Source
  • Gullikson, Eric M.; Mrowka, Stanley; Kaufmann, Benjamin B.
  • 26th Annual International Symposium on Microlithography, SPIE Proceedings https://doi.org/10.1117/12.436712
conference August 2001
Optical constants of magnetron-sputtered boron carbide thin films from photoabsorption data in the range 30 to 770 eV journal January 2008
Soft x-ray mirrors for the Linac Coherent Light Source conference September 2007
Sub-diffraction-limited multilayer coatings for the 03 numerical aperture micro-exposure tool for extreme ultraviolet lithography journal January 2007
High-resolution, high-flux, user friendly VLS beamline at the ALS for the 50–1300eV energy region journal May 1998
Interaction of short x-ray pulses 
with low-Z x-ray optics materials 
at the LCLS free-electron laser journal January 2010
Development, characterization and experimental performance of x-ray optics for the LCLS free-electron laser conference August 2008
X-Ray Interactions: Photoabsorption, Scattering, Transmission, and Reflection at E = 50-30,000 eV, Z = 1-92 journal July 1993
Opto-mechanical design considerations for the Linac Coherent Light Source x-ray mirror system conference August 2008
Wavelength dependence of the damage threshold of inorganic materials under extreme-ultraviolet free-electron-laser irradiation journal September 2009
IMD—Software for modeling the optical properties of multilayer films journal January 1998
Sub-microradian surface slope metrology with the ALS Developmental Long Trace Profiler
  • Yashchuk, Valeriy V.; Barber, Samuel; Domning, Edward E.
  • Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 616, Issue 2-3 https://doi.org/10.1016/j.nima.2009.10.175
journal May 2010
WSXM : A software for scanning probe microscopy and a tool for nanotechnology journal January 2007
Performance of the upgraded LTP-II at the ALS Optical Metrology Laboratory conference August 2008
Atomic force microscopy characterization of Zerodur mirror substrates for the extreme ultraviolet telescopes aboard NASA's Solar Dynamics Observatory journal January 2007

Cited By (1)

A new x-ray optics laboratory (XROL) at the ALS: mission, arrangement, metrology capabilities, performance, and future plans conference September 2014