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Title: Sub-nA spatially resolved conductivity profiling of surface and interface defects in ceria films

Abstract

Spatial variability of conductivity in ceria is explored using scanning probe microscopy with galvanostatic control. Ionically blocking electrodes are used to probe the conductivity under opposite polarities to reveal possible differences in the defect structure across a thin film of CeO2. Data suggest the existence of a large spatial inhomogeneity that could give rise to constant phase elements during standard electrochemical characterization, potentially affecting the overall conductivity of films on the macroscale. The approach discussed here can also be utilized for other mixed ionic electronic conductor systems including memristors and electroresistors, as well as physical systems such as ferroelectric tunneling barriers

Authors:
 [1];  [2];  [3];  [3];  [3];  [3];  [3];  [3];  [3]
  1. Queen's Univ., Belfast, Northern Ireland (United Kingdom)
  2. Univ. of Rome Tor Vergata (Italy)
  3. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Publication Date:
Research Org.:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
1265759
Grant/Contract Number:  
AC05-00OR22725
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
APL Materials
Additional Journal Information:
Journal Volume: 3; Journal ID: ISSN 2166-532X
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Farrow, Tim, Yang, Nan, Doria, Sandra, Belianinov, Alex, Jesse, Stephen, Arruda, Thomas M., Balestrino, Giuseppe, Kalinin, Sergei V., and Kumar, Amit. Sub-nA spatially resolved conductivity profiling of surface and interface defects in ceria films. United States: N. p., 2015. Web. doi:10.1063/1.4914943.
Farrow, Tim, Yang, Nan, Doria, Sandra, Belianinov, Alex, Jesse, Stephen, Arruda, Thomas M., Balestrino, Giuseppe, Kalinin, Sergei V., & Kumar, Amit. Sub-nA spatially resolved conductivity profiling of surface and interface defects in ceria films. United States. doi:10.1063/1.4914943.
Farrow, Tim, Yang, Nan, Doria, Sandra, Belianinov, Alex, Jesse, Stephen, Arruda, Thomas M., Balestrino, Giuseppe, Kalinin, Sergei V., and Kumar, Amit. Tue . "Sub-nA spatially resolved conductivity profiling of surface and interface defects in ceria films". United States. doi:10.1063/1.4914943. https://www.osti.gov/servlets/purl/1265759.
@article{osti_1265759,
title = {Sub-nA spatially resolved conductivity profiling of surface and interface defects in ceria films},
author = {Farrow, Tim and Yang, Nan and Doria, Sandra and Belianinov, Alex and Jesse, Stephen and Arruda, Thomas M. and Balestrino, Giuseppe and Kalinin, Sergei V. and Kumar, Amit},
abstractNote = {Spatial variability of conductivity in ceria is explored using scanning probe microscopy with galvanostatic control. Ionically blocking electrodes are used to probe the conductivity under opposite polarities to reveal possible differences in the defect structure across a thin film of CeO2. Data suggest the existence of a large spatial inhomogeneity that could give rise to constant phase elements during standard electrochemical characterization, potentially affecting the overall conductivity of films on the macroscale. The approach discussed here can also be utilized for other mixed ionic electronic conductor systems including memristors and electroresistors, as well as physical systems such as ferroelectric tunneling barriers},
doi = {10.1063/1.4914943},
journal = {APL Materials},
number = ,
volume = 3,
place = {United States},
year = {Tue Mar 17 00:00:00 EDT 2015},
month = {Tue Mar 17 00:00:00 EDT 2015}
}

Journal Article:
Free Publicly Available Full Text
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Cited by: 2 works
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Works referenced in this record:

Nanoionics: ion transport and electrochemical storage in confined systems
journal, November 2005

  • Maier, J.
  • Nature Materials, Vol. 4, Issue 11, p. 805-815
  • DOI: 10.1038/nmat1513

Redox-Based Resistive Switching Memories - Nanoionic Mechanisms, Prospects, and Challenges
journal, July 2009

  • Waser, Rainer; Dittmann, Regina; Staikov, Georgi
  • Advanced Materials, Vol. 21, Issue 25-26, p. 2632-2663
  • DOI: 10.1002/adma.200900375