Sub-nA spatially resolved conductivity profiling of surface and interface defects in ceria films

Farrow, Tim; Yang, Nan; Doria, Sandra; Belianinov, Alex; Jesse, Stephen; Arruda, Thomas M.; Balestrino, Giuseppe; Kalinin, Sergei V.; Kumar, Amit

doi:10.1063/1.4914943

Title: Sub-nA spatially resolved conductivity profiling of surface and interface defects in ceria films

Journal Article · Tue Mar 17 00:00:00 EDT 2015 · APL Materials

DOI:https://doi.org/10.1063/1.4914943· OSTI ID:1265759

Farrow, Tim ^[1]; Yang, Nan ^[2]; Doria, Sandra ^[3]; Belianinov, Alex ^[3]; Jesse, Stephen ^[3]; Arruda, Thomas M. ^[3]; Balestrino, Giuseppe ^[3]; Kalinin, Sergei V. ^[3]; Kumar, Amit ^[3]

Queen's Univ., Belfast, Northern Ireland (United Kingdom)
Univ. of Rome Tor Vergata (Italy)
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)

Spatial variability of conductivity in ceria is explored using scanning probe microscopy with galvanostatic control. Ionically blocking electrodes are used to probe the conductivity under opposite polarities to reveal possible differences in the defect structure across a thin film of CeO2. Data suggest the existence of a large spatial inhomogeneity that could give rise to constant phase elements during standard electrochemical characterization, potentially affecting the overall conductivity of films on the macroscale. The approach discussed here can also be utilized for other mixed ionic electronic conductor systems including memristors and electroresistors, as well as physical systems such as ferroelectric tunneling barriers

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Research Organization:: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)

Sponsoring Organization:: USDOE Office of Science (SC)

Grant/Contract Number:: AC05-00OR22725

OSTI ID:: 1265759

Journal Information:: APL Materials, Vol. 3; ISSN 2166-532X

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 3 works

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