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Title: Programmer-Guided Reliability for Extreme-Scale Applications

Authors:
 [1];  [1];  [1];  [1];  [1]
  1. ORNL
Publication Date:
Research Org.:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Org.:
Work for Others (WFO)
OSTI Identifier:
1265687
DOE Contract Number:  
AC05-00OR22725
Resource Type:
Conference
Resource Relation:
Conference: Cluster Computing (CLUSTER), 2015 IEEE International Conference on, Chicago, IL, USA, 20150908, 20150911
Country of Publication:
United States
Language:
English

Citation Formats

Bernholdt, David E, Elwasif, Wael R, Kartsaklis, Christos, Lee, Seyong, and Mintz, Tiffany M. Programmer-Guided Reliability for Extreme-Scale Applications. United States: N. p., 2015. Web.
Bernholdt, David E, Elwasif, Wael R, Kartsaklis, Christos, Lee, Seyong, & Mintz, Tiffany M. Programmer-Guided Reliability for Extreme-Scale Applications. United States.
Bernholdt, David E, Elwasif, Wael R, Kartsaklis, Christos, Lee, Seyong, and Mintz, Tiffany M. Thu . "Programmer-Guided Reliability for Extreme-Scale Applications". United States. doi:. https://www.osti.gov/servlets/purl/1265687.
@article{osti_1265687,
title = {Programmer-Guided Reliability for Extreme-Scale Applications},
author = {Bernholdt, David E and Elwasif, Wael R and Kartsaklis, Christos and Lee, Seyong and Mintz, Tiffany M},
abstractNote = {},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Thu Jan 01 00:00:00 EST 2015},
month = {Thu Jan 01 00:00:00 EST 2015}
}

Conference:
Other availability
Please see Document Availability for additional information on obtaining the full-text document. Library patrons may search WorldCat to identify libraries that hold this conference proceeding.

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